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HIGH PERFORMANCE SOLAR CELLS EXCEEDING <strong>17</strong>% EFFICIENCY BASED ON<br />

LOW COST SOLAR GRADE SILICON<br />

P. Preis 1 , P. Diaz-Perez 1 , K. Peter 1 , R. Tronstad 2 , B.R. Henriksen 2 , E. Enebakk 3 , S. Beringov 4 , M. Vlasiuk 4<br />

1 International <strong>Solar</strong> Energy Research Center <strong>Konstanz</strong>, Rudolf-Diesel-Str. 15, D-78467 <strong>Konstanz</strong>, Germany<br />

Phone: +49-(0)7531-36183-6620, Fax: +49-(0)7531-36183-11, Email: pirmin.preis@isc-konstanz.de<br />

2 Elkem Technology, Fiskaaveien 100, N-4675 Kristiansand, Norway<br />

3 Elkem <strong>Solar</strong>, Fiskaaveien 100, N-4675 Kristiansand, Norway<br />

4 Pillar Ltd, member of Pillar Group, Severo-Syretskaya Str.3, 04136, POB 42, Kiev, Ukraine<br />

ABSTRACT: To further establish solar grade silicon from metallurgical process route in the photovoltaic market it is<br />

crucial to demonstrate the material quality by reaching high cell efficiencies and thus enabling SoG-Si to be<br />

competitive to “traditional” poly-Si. In this work we present Elkem <strong>Solar</strong> Silicon (ESS) based solar cells with<br />

efficiencies exceeding <strong>17</strong>% demonstrating the high feedstock quality and a fine tuned solar cell process, which was<br />

optimized in respect to efficient gettering. Investigations of LID behavior of both ESS and poly-Si solar cells show<br />

even lower losses in cell efficiency on the SoG-Si material, which was confirmed by low interstitial oxygen<br />

concentrations measured using FTIR. Further experiments focused on improvements of the reverse current-voltage<br />

characteristics by applying different texturisation methods, which allow for similar cell efficiencies compared to the<br />

standard acidic iso-texturisation.<br />

Keywords: <strong>Solar</strong> Grade Silicon, Multicrystalline Silicon, Degradation, Texturisation<br />

1 INTRODUCTION<br />

Within the last few years Elkem <strong>Solar</strong> as well as <strong>ISC</strong><br />

<strong>Konstanz</strong> were constantly improving their processes with<br />

the aim to achieve solar cell efficiencies above <strong>17</strong>% on<br />

multicrystalline silicon solar cells. For this purpose mc<br />

solar grade silicon wafers from metallurgical process<br />

route originating from center and corner bricks of ingots<br />

produced out of three different kinds of feedstock were<br />

investigated and compared with wafers from poly-Si. All<br />

four ingots were grown in industrial directional<br />

solidification furnaces at Pillar Ltd., two of the ESS<br />

ingots were grown using IMCC technology as a previous<br />

step of purification of UMG-silicon [1]. Adaptations of<br />

the solar cell process regarding a more efficient gettering<br />

during the POCl 3 diffusion were carried out to remove<br />

metallic impurities present in SoG-Si, which act as active<br />

recombination centers and thus limit the carrier lifetime.<br />

Due to the higher boron doping of ESS feedstock<br />

compared to poly-Si feedstock, boron oxygen related<br />

light induced degradation plays an important role for<br />

SoG-Si based solar cells. The results presented in this<br />

work support the assumption of other research groups<br />

[2-5], that a possible boron-phosphorous interaction<br />

might prevent BO 2i complex formation and thus LID is<br />

only related to the net-doping and interstitial oxygen<br />

concentration [6].<br />

Because of the higher doping and impurity<br />

concentrations in SoG-Si the reverse current-voltage<br />

characteristics of SoG-Si based modules are more critical<br />

than in 100% poly-Si based modules. The mechanisms of<br />

breakdown in mc-Si and resulting hot spots have been<br />

shown by Kwapil et al. [7] and Bauer et al. [8],<br />

concluding that also the higher impurity concentrations<br />

and the acidic texturisation, leading to deep etch pits and<br />

thus narrow junction radius which induces a strong<br />

electrical field, can cause poor reverse current-voltage<br />

characteristics. To overcome this problem for SoG-Si<br />

both, a more efficient removal of impurities and the<br />

testing of novel approaches for the texturisation have to<br />

be developed.<br />

2 EXPERIMENTALS<br />

2.1 Optimization of POCl 3 diffusion towards a more<br />

efficient gettering<br />

In the first half of the work the influence of a more<br />

efficient gettering regarding an optimized POCl 3<br />

diffusion was tested and compared to the standard POCl 3<br />

diffusion. The processed wafers originate from corner<br />

and center bricks of four different ingots, three made out<br />

of a mix with 60% ESS and 40% poly-Si, in which two<br />

of them were grown using IMCC technology as a<br />

previous step of purification [1], one made out of 100%<br />

poly-Si. To investigate the effectiveness of the gettering<br />

the two different POCl 3 diffusions were applied to<br />

neighboring wafers from different ingot heights. The<br />

remaining cell process was identical for all wafers<br />

including acidic texturisation, PECVD SiN x deposition,<br />

full Al BSF screen printing, Ag finger grid screen<br />

printing and firing through. Investigations of light<br />

induced degradation (LID) by both accelerated mode [9]<br />

and long term measurements were carried out as well as<br />

FTIR measurements on wafer level to determine<br />

concentrations of interstitial oxygen and its influence on<br />

the LID. Lifetime measurements of PECVD SiN x<br />

passivated samples from different heights of each of the<br />

four ingots were carried out to screen the feedstock<br />

quality.<br />

2.2 Improvements of the reverse current-voltage<br />

characteristics<br />

The second part of this work focused on the<br />

enhancement of the reverse current-voltage<br />

characteristics by applying different texturisation<br />

methods. Five different textures were used, including the<br />

state of the art iso-texturisation, soft iso-texturisation,<br />

alkaline texturisation, an <strong>ISC</strong> recipe which is not<br />

disclosed yet, and NaOH flat etching. The experiments<br />

were carried out on both ESS (Resistivity from 1.1 – 2<br />

Ω*cm, blended with 30% poly-Si) and poly-Si<br />

(Resistivity from 1.4 – 2 Ω*cm) based wafers from two<br />

different brick positions. The wafers used in this<br />

investigation are different in both composition and ingot<br />

origin, compared to the wafers which were used in the<br />

experiment described in chapter 2.1. After the


Average solar cell efficiency [%]<br />

Lifetime [s]<br />

texturisation all samples were processed by POCl 3<br />

diffusion, PECVD SiN x deposition, full Al BSF screen<br />

printing, Ag finger grid screen printing and firing<br />

through. Measurements of the solar cell parameters were<br />

carried out and the reverse current was determined at<br />

-14.5V to see the influence of the texturisation on both<br />

results.<br />

3 RESULTS<br />

3.1 Results of diffusion optimization<br />

Minority carrier lifetime measurements were<br />

performed to screen the feedstock quality of the<br />

investigated ingots. Therefore the saw damage of wafers<br />

from the center bricks of each ingot was removed and the<br />

samples were passivated by a PECVD SiN x . The<br />

lifetimes of those samples were determined using QSSPC<br />

measurements and are shown in figure 1.<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

ESS 1<br />

ESS 2<br />

ESS 3<br />

Poly<br />

0 10 20 30 40 50 60 70 80 90 100<br />

Ingot Height [%]<br />

Figure 1: Minority carrier lifetime of wafers from<br />

different ingot positions, measured by QSSPC. Ingots<br />

ESS 1 and 2 were purified by IMCC and thus are not<br />

made from the standard ESS feedstock.<br />

Lifetimes between 10µs and 60µs have been measured on<br />

both ESS and poly-Si wafers. Figure 1 shows that the<br />

minority carrier lifetime of the ESS based wafers is at<br />

least on the same level or even higher compared to the<br />

poly-Si reference wafers. The bottom wafers of both<br />

ingots ESS 3 and poly show reduced lifetimes most<br />

likely due to some crucible induced impurities. For the<br />

highest wafer positions the lifetime of all four ingots is<br />

decreasing. In case of the poly-Si ingot it is likely that the<br />

higher boron doping at the top, because of the<br />

segregation of impurities is a reason for the decrease in<br />

lifetime. For the ESS based samples dislocations,<br />

found at the higher ingot positions, might limit the carrier<br />

lifetime, because they act as active recombination<br />

centers.<br />

and are thus not made from standard ESS feedstock<br />

Ingot Brick<br />

V oc<br />

[mv]<br />

J sc<br />

[mA/cm²]<br />

FF<br />

[%]<br />

η<br />

[%]<br />

ESS 1 Corner 621.9 33.7 79.5 16.7<br />

ESS 1 Center 618.4 33.5 79.7 16.5<br />

ESS 2 Corner 619.1 33.9 79.3 16.6<br />

ESS 2 Center 616.8 33.8 79.1 16.5<br />

ESS 3 Corner 613.6 33.5 79.1 16.3<br />

ESS 3 Center 618.7 33.9 79.3 16.6<br />

poly Corner 615.1 33.7 79.0 16.4<br />

poly Center 6<strong>17</strong>.1 33.9 79.2 16.6<br />

Table II: Average solar cell parameters over at least 18<br />

cells per brick, which were evenly distributed over the<br />

complete ingot height, processed using an optimized<br />

diffusion regarding more efficient gettering. Ingots ESS 1<br />

and ESS 2 have been grown using IMCC technology as a<br />

previous step of purification and are thus not made from<br />

standard ESS feedstock.<br />

Ingot Brick<br />

V oc<br />

[mv]<br />

J sc<br />

[mA/cm²]<br />

FF<br />

[%]<br />

η<br />

[%]<br />

ESS 1 Corner 623.8 33.8 79.5 16.7<br />

ESS 1 Center 620.2 33.6 79.6 16.6<br />

ESS 2 Corner 620.5 33.9 79.2 16.7<br />

ESS 2 Center 618.4 33.9 79.0 16.6<br />

ESS 3 Corner 614.5 33.5 78.9 16.3<br />

ESS 3 Center 619.8 34.0 79.2 16.7<br />

poly Corner 616.2 33.8 78.9 16.4<br />

poly Center 618.5 34.0 79.2 16.6<br />

The ingots ESS 1 and ESS 2, which were purified using<br />

IMCC technology, show the highest achieved solar cell<br />

efficiencies, due to high FF, because of the low resistivity<br />

and thus a low series resistance, high V oc caused by the<br />

Fermi level shift as a result of the higher boron<br />

concentration and respective higher doping levels [6],<br />

and J sc similar to the reference wafers. Ingot ESS 3<br />

also shows a good performance at the centre brick,<br />

whereas the corner brick shows the lowest average<br />

efficiency of all investigated bricks.<br />

<strong>17</strong>,0<br />

16,8<br />

16,6<br />

16,4<br />

16,2<br />

Optimized<br />

Standard<br />

IV measurements show average efficiencies, over at<br />

least 18 solar cells from each brick, between 16.3% and<br />

16.7% for the ESS based solar cells and between<br />

16.4% and 16.6% for the poly-Si based solar cell<br />

reference (see table I and II).<br />

Table I: Average solar cell parameters over at least 18<br />

cells per brick, which were evenly distributed over the<br />

complete ingot height, processed using the standard<br />

diffusion. Ingots ESS 1 and ESS 2 have been grown<br />

using IMCC technology as a previous step of purification<br />

16,0<br />

ESS 1 Center<br />

ESS 1 Corner<br />

ESS 2 Center<br />

ESS 2 Corner<br />

ESS 3 Center<br />

ESS 3 Corner<br />

Poly Center<br />

Poly Corner<br />

Figure 2: Comparison of average solar cell efficiency of<br />

solar cells diffused by either an optimized or a standard<br />

POCl 3 diffusion. The optimized diffusion was improved<br />

towards a more efficient gettering.<br />

As it can be seen in table I and II and figure 2, the<br />

optimized diffusion leads to an absolute gain of 0.1% in


Interstitial oxygen [ppma]<br />

Reverse current @ -12V [A]<br />

Relative loss in cell efficiency [%]<br />

Relative loss in cell efficiency [%]<br />

cell efficiency for most of the groups, due to enhanced<br />

V oc and J sc values, which we claim to be an effect of a<br />

more efficient gettering. The optimization of the<br />

diffusion leads to solar cell efficiencies exceeding <strong>17</strong>%,<br />

with best solar cells even reaching <strong>17</strong>.1% efficiency. The<br />

results of the best cells of each ingot and brick are shown<br />

in table III.<br />

Table III: <strong>Solar</strong> cell parameter of the best solar cells of<br />

each group. All of the best solar cells were processed<br />

using the optimized diffusion.<br />

Ingot Brick<br />

V oc<br />

[mv]<br />

J sc<br />

[mA/cm²]<br />

FF<br />

[%]<br />

η<br />

[%]<br />

ESS 1 Corner 625.2 33.9 79.5 16.8<br />

ESS 1 Center 628.5 34.1 79.7 <strong>17</strong>.1<br />

ESS 2 Corner 625.0 34.2 79.3 16.9<br />

ESS 2 Center 628.1 34.3 79.4 <strong>17</strong>.1<br />

ESS 3 Corner 615.8 33.8 79.2 16.5<br />

ESS 3 Center 622.1 34.1 79.2 16.8<br />

poly Corner 618.7 34.1 79.3 16.7<br />

poly Center 619.4 34.1 79.4 16.8<br />

Another indication for a more efficient gettering resulting<br />

in lower impurity concentrations on cell level is the<br />

improved reverse current-voltage characteristics. The<br />

reverse breakdown is often caused by metallic impurities<br />

[7]. As shown in figure 3 the solar cells with the<br />

optimized diffusion show an improved reverse current<br />

2<br />

Optimized<br />

Standard<br />

for the SoG-Si based solar cells for most ingot positions,<br />

even though the boron concentrations are higher<br />

compared to the poly-Si. The ingots ESS 1 and ESS 2<br />

show LID mostly below 1%, whereas ingot ESS 3 and<br />

the poly reference show LID up to 1.7% at the bottom<br />

wafers.<br />

1,8<br />

1,6<br />

1,4<br />

1,2<br />

1,0<br />

0,8<br />

0,6<br />

0,4<br />

0,2<br />

0,0<br />

0 10 20 30 40 50 60 70 80 90 100<br />

Figure 4: Relative losses in solar cell efficiencies of solar<br />

cells from the center bricks, depending on the ingot<br />

height.<br />

1,8<br />

1,6<br />

1,4<br />

1,2<br />

1,0<br />

Ingot Height [%]<br />

ESS 1<br />

ESS 2<br />

ESS 3<br />

Poly<br />

ESS 1<br />

ESS 2<br />

ESS 3<br />

Poly<br />

0,8<br />

0,6<br />

1<br />

0<br />

ESS 1 Center<br />

ESS 1 Corner<br />

ESS 2 Center<br />

ESS 2 Corner<br />

ESS 3 Center<br />

ESS 3 Corner<br />

Poly Center<br />

Poly Corner<br />

Figure 3: Comparison of reverse current, as an indicator<br />

of more efficient gettering, of solar cells diffused by<br />

efficient POCl 3 gettering compared to the standard POCl 3<br />

diffusion.<br />

0,4<br />

0,2<br />

0,0<br />

0 10 20 30 40 50 60 70 80 90 100<br />

Ingot Height [%]<br />

Figure 5: Relative losses in solar cell efficiencies of solar<br />

cells from the corner bricks, depending on the ingot<br />

height.<br />

All of the ingots show a decreasing tendency of LID<br />

towards higher ingot positions, what is in good agreement<br />

with FTIR measurements of interstitial oxygen, which<br />

can be seen in figure 6.<br />

LID behavior of solar cells, originating from different<br />

ingot heights ranging from bottom to top from both<br />

center and corner bricks, was investigated. Therefore the<br />

solar cells were exposed to 1 sun illumination at elevated<br />

temperature using a Semilab PV2000 tool, to reach a<br />

completely degraded state due to the formation of BO 2i<br />

complexes. The exact measurement procedure is<br />

explained in [9]. The solar cell parameters were measured<br />

before and after this procedure and the relative loss in<br />

cell efficiency was calculated out of both measurement<br />

results. The results of the relative loss in cell efficiency<br />

for solar cells from the center bricks are shown in figure<br />

4, the results for the solar cells from the corner bricks in<br />

figure 5. The measurement results show lower LID losses<br />

7,00E+0<strong>17</strong><br />

6,00E+0<strong>17</strong><br />

5,00E+0<strong>17</strong><br />

4,00E+0<strong>17</strong><br />

3,00E+0<strong>17</strong><br />

2,00E+0<strong>17</strong><br />

1,00E+0<strong>17</strong><br />

0 10 20 30 40 50 60 70 80 90 100<br />

Ingot Height [%]<br />

ESS 1<br />

ESS 2<br />

ESS 3<br />

Poly


Reverse current @-14.5V [A]<br />

Figure 6: Concentrations of interstitial oxygen of wafers<br />

from different ingot heights, measured using FTIR.<br />

In consideration that bulk resistivity is lower (see table<br />

IV) and respectively the doping level is higher for ESS<br />

based solar cells, these results lead to the conclusion that<br />

LID is rather relating to the net doping and the interstitial<br />

oxygen concentration than to the absolute boron<br />

concentration. This supports the assumption that<br />

phosphorous in compensated silicon somehow prevents<br />

the formation of BO 2i , what was stated by different<br />

research groups before [2-5].<br />

Table IV: Bulk resistivity of investigated wafers<br />

Ingot<br />

Resisitvity [Ω*cm]<br />

Center brick Corner brick<br />

ESS 1 1.0 – 1.2 1.0 – 1.4<br />

ESS 2 1.4 – 2.3 1.4 – 2.0<br />

ESS 3 1.5 – 1.7 1.5 – 1.7<br />

poly 1.5 – 1.8 1.4 – 1.9<br />

3.2 Results of reverse current-voltage characteristics<br />

optimization<br />

Table V shows the average solar cell parameters over<br />

at least 12 solar cells of each group from positions<br />

covering the complete ingot height, which were<br />

processed using different texturisation methods. The soft<br />

iso texturisation was processed with the texturisation<br />

bath, but less silicon was removed compared to the<br />

standard iso-texturisation. The <strong>ISC</strong> recipe is not disclosed<br />

yet.<br />

Table V: Average solar cell parameters of solar cells,<br />

processed by different texturisations.<br />

Ingot Texture V oc<br />

[mV]<br />

70%<br />

ESS<br />

100%<br />

poly<br />

J sc<br />

[mA/cm²]<br />

FF<br />

[%]<br />

Eta<br />

[%]<br />

Iso 618.7 33.1 79.2 16.2<br />

Soft iso 615.7 33.2 79.4 16.2<br />

<strong>ISC</strong> 616.8 33.3 78.8 16.2<br />

Alkaline 6<strong>17</strong>.8 33.4 79.1 16.3<br />

NaOH 620.5 32.6 79.4 16.1<br />

Iso 614.9 34.2 78.9 16.6<br />

Soft iso 612.6 34.3 78.8 16.5<br />

<strong>ISC</strong> 614.2 34.2 78.7 16.5<br />

Alkaline 613.6 34.2 78.8 16.5<br />

NaOH 616.0 33.5 78.8 16.3<br />

As table V shows the solar cell efficiencies of almost all<br />

groups are similar. Only the NaOH flat etched solar cells<br />

show lower cell efficiencies, due to higher reflectivity<br />

resulting in lower J sc values. Depending on the<br />

texturisation the open-circuit of the solar cells is varying<br />

as a consequence of the different surface areas and thus<br />

different surface recombination velocities. The NaOH flat<br />

etched cells show the highest V oc due to the lowest<br />

surface area, whereas the wafers treated by the soft isotexturisation<br />

show the lowest V oc , most likely because the<br />

saw damage was not removed sufficiently. In general the<br />

ESS based solar cells show lower performance than the<br />

poly-Si based solar cells, due to significantly lower short<br />

circuit currents.<br />

The influence of the different texturisation methods<br />

on the reverse current-voltage characteristics is shown in<br />

figure 7. For the poly-Si solar cells there is only a slight<br />

influence of the texturisation on the reverse current. Both<br />

versions of the iso-texturisation lead to reverse current<br />

values of 1.9 A and 1.5 A respectively, whereas the other<br />

three texturisations lead to reverse currents below 1.2 A.<br />

Even the higher values of the iso-texturisations are in a<br />

non critical region regarding possible hot spots in solar<br />

modules. For the ESS based solar cells the reverse<br />

current generally is higher, due to higher doping levels<br />

and assumable higher concentrations of impurities. The<br />

SoG-Si solar cells treated by the two versions of the isotexturisation<br />

show high reverse currents above 10 A,<br />

measured at a reverse voltage of -14.5 V. The mixed<br />

texturisation, the alkaline texturisation and the NaOH flat<br />

etching leads to reduced reverse current values between<br />

1.9 A and 3.6 A.<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

Figure 7: Average reverse currents, measured at -14.5 V,<br />

depending on the used wafer material and the applied<br />

texturisation.<br />

The lowest reverse current was obtained on the NaOH<br />

flat etched solar cells, due to the reduced influence of the<br />

solar cells surface, but at the same time the solar cell<br />

efficiency of those cell is the lowest. The alkaline<br />

texturisation shows the best combination of solar cell<br />

efficiency with 16.3% and a low reverse current of 3.2 A<br />

at -14.5V reverse voltage and thus seems to be a<br />

sufficient solution to prevent possible hot spots in ESS<br />

based solar modules, while allowing for high efficiencies.<br />

4 CONCLUSIONS<br />

iso soft iso <strong>ISC</strong> alka NaOH<br />

Texturisation<br />

70% ESS<br />

100% Poly<br />

The high quality of ESS feedstock was confirmed<br />

achieving solar cell efficiencies exceeding <strong>17</strong>% with best<br />

cells showing <strong>17</strong>.1% cell efficiency. The obtained cell<br />

results demonstrate that the ingots purified by IMCC<br />

show high solar cell performance and low LID, indicating<br />

that this technology can be an effective alternative for<br />

final purification of SoG-Si. An industrially applicable,<br />

regarding more efficient gettering optimized, POCl 3<br />

diffusion was investigated leading to a gain of 0.1% in<br />

absolute cell efficiency, due to higher V oc and J sc . The<br />

reverse current could also be lowered by the optimized<br />

diffusion, indicating a more efficient removal of<br />

impurities. Generally V oc and FF is higher for ESS based<br />

solar cell, because of the higher boron doping and thus a<br />

Fermi level shift and low resistivity, whereas Jsc appears


to be comparable to poly-Si based solar cells. The<br />

obtained results indicate the potential of ESS for high<br />

efficiency approaches.<br />

Applying an alkaline texturisation to mc wafers lead<br />

to an improvement of the reverse current-voltage<br />

characteristics of ESS based solar cells, while solar cell<br />

efficiency is similar or even higher compared to the state<br />

of the art acidic iso-texturisation, what can help to<br />

prevent hot spots in ESS based solar modules.<br />

5 REFERENCES<br />

[1] S. Beringov et al., New approach to SoG-Si pretreatment<br />

technology and parameters of solar cells<br />

produced with application thereof, 27 th EUPVSEC,<br />

Hamburg, Germany, (2012).<br />

[2] D. Macdonald et al., Boron-oxygen defects in<br />

compensated p-type Czochralski silicon, 24 th<br />

EUPVSEC, Hamburg, Germany, (2009).<br />

[3] R. Kopecek et al., Crystalline Si solar cells from<br />

compensated material; behavior of light induced<br />

degradation, 23 rd EUPVSEC, Valencia, Spain,<br />

(2008).<br />

[4] J. Libal et al., Effect of compensation and of metallic<br />

impurities on the electrical properties of Cz-grown<br />

solar grade silicon, Journal of Applied Physics 104,<br />

(2008).<br />

[5] K. Peter et al., Future potential for SoG-Si feedstock<br />

from the metallurgical process route, 23 rd EUPVSEC,<br />

Valencia, Spain, (2008).<br />

[6] K. Peter et al., Towards <strong>17</strong>% efficient multicrystalline<br />

solar grade silicon solar cells, 25 th EUPVSEC,<br />

Valencia, Spain, (2010).<br />

[7] W. Kwapil et al., Physical mechanisms of breakdown<br />

in multicrystalline silicon solar cells, 24 th EUPVSEC,<br />

Hamburg, Germany, (2009).<br />

[8] J. Bauer et al., Hot spots in multicrystalline silicon<br />

solar cells: avalanche breakdown due to etch pits,<br />

physica status solidi RRL 3, No.2, (2009).<br />

[9] M. Wilson et al., Accelerated light-induced<br />

degradation (ALID) for monitoring of defects in PV<br />

silicon wafers and solar cells, Journal of electronics<br />

mat., Vol 39, No.6, (2010).

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