International Reactor Dosimetry File 2002 - IAEA Publications

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10 2 Damage (MeV· mb) 10 1 10 0 10 –1 10 –10 10 –9 10 –8 10 –7 10 –6 10 –5 10 –4 10 –3 10 –2 10 –1 10 0 10 1 10 2 Neutron energy (MeV) FIG. 8.5. Energy dependence of the GaAs damage function. REFERENCES TO SECTION 8 [8.1] 1997 Annual Book of ASTM Standards, Vol. 12.02: Nuclear (II), Solar, and Geothermal Energy, American Society for Testing and Materials, Philadelphia, PA (1997). [8.2] MacFARLANE, R.E., MUIR, D.W., The NJOY nuclear data processing system, Version 91, Los Alamos Natl Lab., LA-12740-M, October 1994; code updated to Version 97.0 in a “Readme0” memorandum by R.E. MacFarlane dated 31 October 1997 — this version of the code is distributed by the Radiation Safety Information Computational Center at Oak Ridge Natl Lab. as code package PSR-368; Version 97.45 is further updated, and is available using an update file from the web address http://t2.lanl.gov/codes/njoy97/ [8.3] ROBINSON, M.T., “The energy dependence of neutron radiation damage in solids”, Nuclear Fusion <strong>Reactor</strong> (Proc. Int. Conf. Culham, UK, 1969), British Nuclear Energy Society, London (1970) 364–377. [8.4] LINDHARD, J., SCHARFF, M., SCHIØTT, H.E., Range concepts and heavy ion ranges (notes on atomic collisions, II), K. Dan. Vidensk. Selsk., Mat.-Fys. Medd. 33 14 (1963). [8.5] NORGETT, M.J., ROBINSON, M.T., TORRENS, I.M., A proposed method of calculating displacement dose rates, Nucl. Eng. Des. 33 (1975) 50. [8.6] TULI, J.K., Nuclear Wallet Cards, Brookhaven Natl Lab., Upton, NY (1990). [8.7] ROGERS, V.C., HARRIS, L., Jr., STEINMAN, D.K., BRYAN, D.E., Silicon ionization and displacement kerma for neutrons from thermal to 20 MeV, IEEE Trans. Nucl. Sci. NS-22 (1975) 2326; Erratum, NS-23 (1976) 875. [8.8] SPARKS, M.H., et al., Energy dependence of neutron damage in silicon bipolar transistors, IEEE Trans. Nucl. Sci. NS-36 (1989) 1904. 97
[8.9] GRIFFIN, P.J., KELLY, J.G., LUERA, T.F., BARRY, A.L., LAZO, M.S., Neutron damage equivalence in GaAs, IEEE Trans. Nucl. Sci. NS-38 (1991) 1937. [8.10] LUERA, T.F., et al., Neutron damage equivalence for silicon, silicon dioxide and gallium arsenide, IEEE Trans. Nucl. Sci. NS-34 (1987) 1557. [8.11] AVERBACK, R., BENEDEK, R., MERKLE, K.L., Ion-irradiation studies of the damage function of copper and silver, Phys. Rev. B 18 (1978) 4156. [8.12] CONRAD, E.E., Considerations in establishing a standard for neutron displacement effects in semiconductors, IEEE Trans. Nucl. Sci. NS-18 (1971) 200. 98
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INTERNATIONAL REACTOR DOSIMETRY FIL
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TECHNICAL REPORTS SERIES No. 452 IN
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FOREWORD An accurate and complete k
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Contributing authors O. Bersillon C
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5.1. Plots of experimental data and
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1. INTRODUCTION R. Paviotti-Corcuer
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(b) (c) Pointwise data: (i) All dos
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REFERENCES TO SECTION 1 [1.1] ZIJP,
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cross-sections, and as a consequenc
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TABLE 2.1. MEASURED AND CALCULATED
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TABLE 2.2. MEASURED AND CALCULATED
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[2.24] KOBAYASHI, K., KIMURA, I., M
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from ENDF/B-VI Release 8, JEFF-3.0
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TABLE 3.1. REACTIONS FROM THE VARIO
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Fluence rate per unit energy (m -2
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TABLE 3.2. COMPARISON OF THE INTEGR
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— 10 B(n,α) 7 Li and 6 Li(n,t) 4
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TABLE 3.3. THERMAL NEUTRON CROSS-SE
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TABLE 3.4. RELATIVE STANDARD DEVIAT
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[3.14] HOLDEN, N.E., “Neutron sca
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The rigorous inclusion of all uncer
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TABLE 4.1. C/E VALUES IN THE CALIFO
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TABLE 4.3. IRDF-90.2 ( DATA IN A CA
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TABLE 4.3. IRDF-90.2 ( DATA IN A CA
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TABLE 4.4. JENDL/D-99 ( DATA IN A C
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TABLE 4.4. JENDL/D-99 ( DATA IN A C
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TABLE 4.5. UPDATED RRDF-98 ( DATA I
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REFERENCES TO SECTION 4 [4.1] KOCHE
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Page 62 and 63: TABLE 5.1. CROSS-SECTION EVALUATION
Page 64 and 65: TABLE 5.1. CROSS-SECTION EVALUATION
Page 66 and 67: — 58 Ni(n,2n) 57 Ni: The IRDF, JE
Page 68 and 69: — 238 U(n,γ) 239 U(β - ) 239 Np
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Page 72 and 73: TABLE 6.1. INTEGRAL CHARACTERISTICS
Page 74 and 75: TABLE 6.1. INTEGRAL CHARACTERISTICS
Page 76 and 77: TABLE 6.2. CROSS-SECTIONS IN IRDF-2
Page 84 and 85: 7. CONSISTENCY TEST OF THE CROSS-SE
Page 86 and 87: TABLE 7.1. REFERENCE NEUTRON FIELDS
Page 88 and 89: Fluence, (E) (MeV -1 ) 10 7 10 6 10
Page 90 and 91: TABLE 7.2. SPECTRUM AVERAGED DOSIME
Page 92 and 93: testing of electronic components an
Page 94 and 95: Table 7.3 details the 34 dosimetry
Page 96 and 97: 7.2. RESULTS OF CONSISTENCY TESTING
Page 98 and 99: TABLE 7.4. RATIO OF SPECTRUM AVERAG
Page 104 and 105: [7.7] SEKINE, T., MAEDA, S., AOYAMA
Page 106 and 107: ecommendations found in ASTM practi
Page 108 and 109: 10 2 Damage (MeV· mb) 10 1 10 0 10
Page 112 and 113: 9. DECAY DATA AND ISOTOPIC ABUNDANC
Page 114 and 115: 9.1.4. Data processing The required
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Page 119 and 120: TABLE I.1. METROLOGY REACTIONS (ACT
Page 121 and 122: For the convenience of the metrolog
Page 123 and 124: Such approximate calculations are n
Page 125 and 126: of each neutron energy group. These
Page 127 and 128: activation rate for the product iso
Page 129 and 130: III.1. THERMAL CROSS-SECTIONS Gener
Page 131 and 132: TABLE III.1. COMPARISON OF THERMAL
Page 133 and 134: TABLE III.2. COMPARISON OF CAPTURE
Page 135 and 136: TABLE III.3. COMPARISON OF THE Q 0
Page 137 and 138: — 50 Cr: Compared with the Mughab
Page 139 and 140: REFERENCES TO APPENDIX III [III.1]
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CONTRIBUTORS TO DRAFTING AND REVIEW
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CONTRIBUTORS TO DRAFTING AND REVIEW
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