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A New Scanning Method for Fast Atomic Force Microscopy - NT-MDT

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This article has been accepted <strong>for</strong> publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication.363Pxs (µm)6303(a)ys (µm)0361 2 3 4 5 6 76 3 0 3 6x s (µm)Figure 2. Spiral scan of 6 µm radius with number o f curve = 8.where number o f curves is defined as the number of timesthe spiral curve crosses through the line y = 0. This isexemplified in Fig. 2 where the crossing points are numbered.The figure illustrates a spiral scan of 6 µm radius withnumber o f curves = 8.The equation that describes the total scanning time t total associatedwith a CAV spiral scan can be derived by integratingboth sides of equation (1) as∫r end∫t enddr = Pω dt (5)2πr start t startwhere r start and r end are initial and final values of the spiralradius, and t start and t end are initial and final values of thescanning time. From equation (5), if r start = 0 at t start = 0 andt total = t end −t start , we obtaint total = 2πr endPω . (6)In order to implement the spiral scans using a piezoelectrictube scanner, equation (3) needs to be translated into cartesiancoordinates. The trans<strong>for</strong>med equations areandx s = r cosθ (7)y s = r sinθ (8)where x s and y s are input signals to be applied to the scanner inthe x and y axes respectively and θ is the angle. From ω =dt dθ ,θ is obtained as θ = ωt. An example of input signals x s andy s that can generate the spiral in Fig. 2 is plotted in Fig. 3.The figure illustrates constant phase errors between the inputsignals and measured outputs. Such errors are due to the nonidealfrequency response of the controlled nanopositioner. Fora CAV spiral, these phase errors can be easily eliminated byadding phase constants α x and α y to shape the input signalsasX s = r cos(θ + α x ) (9)andY s = r sin(θ + α y ). (10)8ys (µm)60 0.04 0.08 0.12t (s)(b)630360 0.04 0.08 0.12t (s)Figure 3. Input signals to be applied to the scanner in the x and y axes ofthe scanner to generate CAV spiral scan with ω = 188.50 radians/sec. Solidline is the achieved response and dashed line is the desired trajectory.Here, α x and α y are determined by measuring the closed-loopfrequency response of the system at the scan frequency. Theymay also be determined off-line if a model of the system isat hand.A key advantage of using a CAV spiral is that closed-looptracking of this pattern when implemented via the cartesianequations only involves tracking single frequency sinusoidalsignals with slowly varying amplitudes. This advantage, whencombined with the use of the shaped input signals (9) and (10),enables the AFM’s scanner to track a high frequency CAVspiral resulting in fast atomic <strong>for</strong>ce microscopy. A drawbackof this method is that its linear velocity v is not constant. Thus,it may not be suitable <strong>for</strong> scanning some samples where theinteraction between the probe and the sample needs to be doneat linear velocity. The CLV spiral presented next overcomesthis problem.B. The CLV spiralIn order to generate a CLV spiral, the radius ˜r and angularvelocity ˜ω need to be varied simultaneously in a way thatthe linear velocity of the nanopositioner is kept constant atall times. The expressions <strong>for</strong> ˜r and ˜ω are first derived bysubstituting ω = v rinto equation (1) to obtaindrdt = Pv(11)2πrwhere v is the linear velocity of the CLV spiral. Then, equation(11) is solved <strong>for</strong> r by integrating both sides of the equationas∫rdr = Pv ∫dt. (12)2πFor r = 0 at t = 0, we obtain√Pv˜r = t. (13)πFrom equation (13), by substituting ˜r = ṽ the expression <strong>for</strong>ω˜ω is obtained as √πv˜ω =Pt . (14)Copyright (c) 2009 IEEE. Personal use is permitted. For any other purposes, Permission must be obtained from the IEEE by emailing pubs-permissions@ieee.org.Authorized licensed use limited to: University of <strong>New</strong>castle. Downloaded on November 26, 2009 at 00:02 from IEEE Xplore. Restrictions apply.

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