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Materials Science and Engineering Laboratory FY 2004 ... - NIST

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On the Cover:<br />

From the front cover <strong>and</strong> continuing on to the back, the images shown are,<br />

respectively:<br />

Fig. 1 – Optical coherence microscope/confocal fluorescence microscope image<br />

of a polymer tissue engineering scaffold;<br />

Fig. 2 – False color micrograph of a nanoporous insulation film using the strain<br />

induced elastomer buckling instability for mechanical measurements (SIEBIMM)<br />

method;<br />

Fig. 3 – Profilometry image of a fluidics device master prepared by patterning an<br />

optical resin; <strong>and</strong><br />

Fig. 4 – Image displaying the Fourier transform of the average line cross section<br />

in a photoresist after etching as measured by critical dimension small angle x-ray<br />

scattering (CD-SAXS).<br />

More information about each of these topics can be found within this report.

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