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Kinetic and Strain-Induced Self-Organization of SiGe ...

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12 CHAPTER 1. SILICON-GERMANIUM MATERIAL SYSTEM<br />

Figure 1.9: Lattice parameters <strong>of</strong> Si1−xGex alloys <strong>and</strong> deviation from Vegard’s<br />

rule [51].<br />

� Source: <strong>SiGe</strong> Vegards-rule.jpg<br />

1.4 Silicon Germanium Alloys (Si1−xGex)<br />

Silicon <strong>and</strong> germanium form a continuous series <strong>of</strong> solid solutions Si1−xGex providing a grad-<br />

ual change in some parameters (e.g. lattice parameter a) with x ranging from 0 to 1 [3].<br />

The lattice parameter a<strong>SiGe</strong> <strong>of</strong> Si1−xGex alloys shows a small deviation from Vegard’s rule,<br />

i.e. from the linearity between the lattice constants <strong>of</strong> pure Si <strong>and</strong> Ge. According to ex-<br />

periments by Dismukes et al. [51] (see Fig. 1.9) <strong>and</strong> theoretical Monte Carlo simulations <strong>of</strong><br />

Si1−xGex alloys the lattice constant for Si1−xGex alloys a<strong>SiGe</strong> lies below Vegard’s rule [5].<br />

1.4.1 B<strong>and</strong>structure <strong>of</strong> <strong>SiGe</strong>-Heterostructures<br />

The lattice mismatch (4.2%) strain between Si <strong>and</strong> Ge enables b<strong>and</strong> engineering for <strong>SiGe</strong>-<br />

heterostructures. Due to the different symmetries in Si- <strong>and</strong> Ge-b<strong>and</strong> structure the <strong>SiGe</strong>-<br />

alloy b<strong>and</strong>structure shows a cross-over in the lowest conduction b<strong>and</strong> edge from Si-like [100]-<br />

symmetry to Ge-like [111]-symmetry at x ∼ 0.85 [3]. Fig. 1.10 [6, 52] shows the compositional<br />

dependence <strong>of</strong> the indirect energy gap for unstrained Si1−xGex alloys with the change from<br />

the conduction b<strong>and</strong> (CB) minimum at the ”∆”-point (Si-like) to the L-point (Ge-like) (upper<br />

curve in Fig. 1.10). The two lower curves show the vast influence <strong>of</strong> strain for pseudomorphic<br />

<strong>SiGe</strong>-layers on a Si-substrate. The in-plane compressively strained <strong>SiGe</strong>-layers show a signif-<br />

icantly lowered b<strong>and</strong>gap with a splitting <strong>of</strong> the valence b<strong>and</strong> (VB) maximum in heavy-hole<br />

(HH) <strong>and</strong> light-hole (LH) b<strong>and</strong>. [6, 52]

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