Catalog - PIKE Technologies

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ATRMax II System ConfigurationsPA R T N U M B E R023-10XX023-11XX023-12XXD E S C R I P T I O NATRMax II Trough Plate System with 45º ZnSe CrystalIncludes: Trough Plate, Volatiles Cover and Powder PressATRMax II Flat Plate System with 45º ZnSe CrystalIncludes: Flat Plate and HATR Pressure ClampATRMax II Combined Trough and Flat Plate Systemwith 45º ZnSe CrystalsIncludes Trough Plate, Flat Plate, Volatiles Cover, PowderPress and Sample ClampNotes: ATRMax II Systems may be purchased with crystal plates other than ZnSe.Just add – Ge for germanium, -KR for KRS-5, -AM for AMTIR, or – Si for Silicon.Additional plates can be added to an order for any system above. Other configurationsmay be selected from the options below.ATRMax II Base Optics (must select, insert spectrometer model for XX)PA R T N U M B E RD E S C R I P T I O N023-19XX ATRMax II Variable Angle HATRNotes: ATRMax II Base Optics includes volatiles cover, powder press, purge tubes,purge kit and spectrometer base mount.ATRMax II Crystal Plates (must select 1 or more)PA R T N U M B E RD E S C R I P T I O N023-2001 Trough Plate, ZnSe, 45°023-2011 Flat Plate, ZnSe, 45°023-2021 Trough Plate, ZnSe, 30°023-2031 Flat Plate, ZnSe, 30°023-2041 Trough Plate, ZnSe, 60°023-2051 Flat Plate, ZnSe, 60°023-2003 Trough Plate, Ge, 45°023-2013 Flat Plate, Ge, 45°023-2023 Trough Plate, Ge, 30°023-2033 Flat Plate, Ge, 30°023-2043 Trough Plate, Ge, 60°023-2053 Flat Plate, Ge, 60°023-2046 Trough Plate, AMTIR, 45°023-2047 Flat Plate, AMTIR, 45°023-2002 Trough Plate, KRS-5, 45°023-2012 Flat Plate, KRS-5, 45°023-2022 Trough Plate, KRS-5, 30°023-2032 Flat Plate, KRS-5, 30°023-2042 Trough Plate, KRS-5, 60°023-2052 Flat Plate, KRS-5, 60°023-2044 Trough Plate, Si, 45°023-2045 Flat Plate, Si, 45°Notes: ATRMax Crystal Plates are pre-aligned and pinned-in-place. Changing crystalplates is easy and fast to optimize sampling results. If you need a crystal plate notlisted here, please contact us.ATRMax II Pressure ClampP A R T N U M B E RD E S C R I P T I O N023-3050 ATRMax Pressure ClampNotes: The pressure clamp is required for solids, films, coatings and powdered samples.O R D E R I N G I N F O R M A T I O NATRMax II Sampling OptionsPA R T N U M B E RD E S C R I P T I O N023-2800 Motorized Upgrade for ATRMax II023-2850 Motorized Option for ATRMax II090-1000 Manual Polarizer, ZnSe090-2000 Automated Polarizer, ZnSe023-2300 RCPlate for ATRMax II023-4000 ATRMax Flow Cell Assembly (Order crystal separately)023-4100 ATRMax Liquid-Jacketed Flow Cell Assembly(Order crystal separately)023-4200 ATRMax Heated Flow Cell Assembly (Order crystal separately)023-4300 ATRMax Heated Trough Plate Assembly (Order crystal separately)023-4400 ATRMax Heated Flat Plate Assembly (Order crystal separately)013-4200 ATR Variable Angle Heating Conversion Plate076-1420 Digital Temperature Control Module, PC Control076-1220 Digital Temperature Control ModuleNotes: Motorized Option includes PIKE Technologies AutoPRO software and controller.Other polarizer options are found in the polarization section of this catalog. TheATR Variable Angle Heating Conversion Plate must be selected with temperaturecontrolled crystal plates. Resistively heated crystal plates require selection of theTemperature Control Module. Maximum crystal temperature is 120 °C.ATRMax II CrystalsPA R T N U M B E RD E S C R I P T I O N023-3110 Crystal, 45°, Trap., 56 x 10 x 4, ZnSe023-3130 Crystal, 60°, Trap., 56 x 10 x 4, ZnSe023-3120 Crystal, 30°, Trap., 56 x 10 x 4, Ge023-3112 Crystal, 45°, Trap., 56 x 10 x 4, Ge023-3132 Crystal, 60°, Trap., 56 x 10 x 4, Ge023-3121 Crystal, 30°, Trap., 56 x 10 x 4, Si023-3114 Crystal, 45°, Trap., 56 x 10 x 4, Si023-3134 Crystal, 60°, Trap., 56 x 10 x 4, Si023-3113 Crystal, 45°, Trap., 56 x 10 x 4, AMTIR023-3133 Crystal, 60°, Trap., 56 x 10 x 4, AMTIRNotes: Please contact PIKE Technologies for crystals not on this list.ATRMax II Replacement PartsPA R T N U M B E RD E S C R I P T I O N023-3051 ATRMax II Volatiles Cover023-3052 ATRMax II Powder PressNotes: Please contact PIKE Technologies for items not described in this list.Reconditioning service for used ATRMax crystal plates is available.R E S I S T I V E LY H E AT E D ATRMAX II P L AT E S S P E C I F I C AT I O N STemperature Range Ambient to 120 °CAccuracy +/- 0.5%Voltage24 VDCSensor Type3 wire Pt RTD (low drift, high stability)ControllerDigital+/- 0.5% of set pointDigital PC+/- 0.5% of set point, graphical setup,up to 10 ramps, USB interfaceInput Voltage90–264 V, auto setting, externalpower supplyOperating Voltage 24 VDC/36 WA T T E N U A T E D T O T A L R E F L E C T A N C E – L I Q U I D S , S O L I D S A N D I N - B E T W E E N23
24P I K E T E C H N O L O G I E S W W W . P I K E T E C H . C O M 6 0 8 - 2 7 4 - 2 7 2 1VeeMAX III with ATR –Variable Angle, Single Reflection ATR for Depth Profiling StudiesF E A T U R E S O F T H E V E E M A X I I I W I T H AT R• Continuously variable set angle of incidence – 30 to 75 degrees• 0.4 to 46 micron depth of penetration – dependent on crystalmaterial, angle of incidence, sample’s refractive index andwavelength of IR beam – ideal for depth profiling studies• High throughput for excellent quality spectra in a shorttime period• Optional, high-pressure clamp for sampling of films, coatingsor powdered samples• Integrated position for optional manual or automatedpolarization• Motorized option with electronic control module and AutoPROsoftware for automated, high-precision experiments• VeeMAX III can be used as a variable angle of incidencespecular reflection accessory• Configurable for specialized applications – monolayer studiesand spectroelectrochemistry• Sealed and purgeable optical design to eliminate watervapor and carbon dioxide interferencesThe VeeMAX III with ATR offers continuous variable angle of incidenceand a variety of crystal plates to selectively control the depth ofpenetration of the IR beam into the sample. ATR applicationsinclude the study of layered samples, coatings, release agents,monolayers on silicon and chemical migration studies.The VeeMAX III with ATR accessory provides exceptionallyhigh throughput (over 50% with 45 degree ZnSe crystal) to minimizesampling time and enable detection of low concentration componentsin samples of complex composition. The flat plate crystalsoffered for the VeeMAX III are ideal for solid and layered samplesand are designed for use with the optional pressure clamp. Thecombination of large crystal diameter (20 mm) and slip-clutchpressure clamp provides sample to crystal contact without alteringlayered sample composition. The optional liquids retainer may beadded to the crystal plate for analysis of liquid samples.Depth profiling study of layered polymer film. FTIR spectra collectedusing ZnSe crystal at set angles of incidence from 43 to 65 degrees.IR absorbance band at 1591 cm -1 clearly increases relative to otherbands as we probe deeper into the sample.Monolayers and ultra-thin films absorbed on silicon or goldsubstrate are easily sampled using the VeeMAX III equipped with ahigh refractive index ATR crystal. Compared to specular reflectancesampling for monolayer analysis, an increase in sensitivity of upto 1–2 orders of magnitude may be realized via ATR sampling.For these applications, the VeeMAX III accessory is configured toinclude a high-angle Ge flat plate (60° or 65°), the VeeMAX IIIhigh-pressure clamp with a 7.8 mm pressure tip, and a polarizer.Analysis of monomolecular layer on silicon – VeeMAX III with 60 degreeGe crystal, pressure clamp with 7.8 mm tip and p polarization.A spectroelectrochemical cell option for the VeeMAX III is alsoavailable. The innovative design offers a polytetrafluoroethylenecup sealed to an ATR crystal, which is mounted on the VeeMAX.The crystals are interchangeable for optimizing spectral resultsand are removable to allow electrode coating on the ATR surface.The high throughput of the VeeMAX with ATR provides excellentsensitivity and reduced sampling time. Additionally, a flat IRtransparent window may be installed instead to permit specularreflectance sampling. The electrochemistry cell is equipped with aprecision micrometer for electrode positioning.
Page 2 and 3: The PIKE Technologies team looksfor
Page 4 and 5: TA B L E O F C O N T E N T SPages 1
Page 6 and 7: Pages 81-114Transmission Sampling -
Page 8 and 9: Sampling KitsIf you are not sure wh
Page 10 and 11: Comprehensive Transmission Sampling
Page 12 and 13: Valu-Line - High Performance Set of
Page 14 and 15: Attenuated Total ReflectanceATR pro
Page 16 and 17: MIRacle Crystal OptionsThe MIRacle
Page 18 and 19: MIRacle Base Optics (must select, i
Page 20 and 21: Selection of the digital control mo
Page 22 and 23: G L A D IATR V I S I O N A C C E S
Page 24 and 25: Multiple Reflection HATR -Maximum S
Page 26 and 27: A large number of temperature-contr
Page 28 and 29: ATRMax II Variable Angle Horizontal
Page 32 and 33: Spectroelectrochemical cell with re
Page 34 and 35: JetStream ATR Accessory -Measuremen
Page 36 and 37: ATR - Theory and ApplicationsAttenu
Page 38 and 39: Porous Foam Sample with High Pressu
Page 40 and 41: Diffuse ReflectanceDiffuse reflecta
Page 42 and 43: DiffusIR -Research Grade Diffuse Re
Page 44 and 45: UpIR -Upward Looking Diffuse Reflec
Page 46 and 47: X, Y Autosampler - Transmission and
Page 48 and 49: Diffuse Reflectance - Theory and Ap
Page 50 and 51: Specular ReflectanceSpecular reflec
Page 52 and 53: Changing the angle of incidence wit
Page 54 and 55: 80Spec -Grazing Angle Specular Refl
Page 56 and 57: 10Spec -Near-normal Sample Reflecti
Page 58 and 59: Specular Reflectance - Theory and A
Page 60 and 61: PolarizationPolarizers may be used
Page 62 and 63: Infrared Polarizers - Theory and Ap
Page 64 and 65: Integrating SpheresIntegrating sphe
Page 66 and 67: A selection of Mercury cadmium tell
Page 68 and 69: Quantitative measurement of active
Page 70 and 71: A well-designed sphere has the samp
Page 72 and 73: Remote SamplingAccessoriesHollow wa
Page 74 and 75: F L E XIR A C C E S S O RY S P E C
Page 76 and 77: Heated Liquid Sample Holder -Charac
Page 78 and 79: MicrosamplingMicrosampling accessor
Page 80 and 81:
Switching from transmission to refl
Page 82 and 83:
Compact Transmission/Reflection S84
Page 84 and 85:
Micro Diamond Cell -For Compressing
Page 86 and 87:
Beam CondensersP A R T N U M B E R0
Page 88 and 89:
Transmission SamplingTransmission s
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RotatIR -Automated Rotating Sample
Page 92 and 93:
X, Y Autosampler - Transmission and
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Demountable Liquid Cells -For Versa
Page 96 and 97:
Long-Path Quartz Liquid Cells -For
Page 98 and 99:
Demountable Liquid Cell Windows(mus
Page 100 and 101:
Cryostat190 - Ultralow Temperature
Page 102 and 103:
Bolt Press & Hydraulic Die - Low-Co
Page 104 and 105:
Heated Platens Accessory - For Maki
Page 106 and 107:
Auto-CrushIR -Programmable Hydrauli
Page 108 and 109:
Sample Preparation Accessories -For
Page 110 and 111:
Disks, Windows and Powders -For Tra
Page 112 and 113:
Disks, 41 mm Diameter3 mm Thickness
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Short-Path Gas Cells -For Samples w
Page 116 and 117:
Long-Path Gas Cells -For Measuremen
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Transmission Sampling Techniques -
Page 120 and 121:
An alternate method for analysis of
Page 122 and 123:
Special ApplicationsPIKE Technologi
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MappIR and MAP300 -For Automated An
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TGA/FTIR Accessory - Identification
Page 128 and 129:
GC-FTIR Accessory -Combining GC Sep
Page 130 and 131:
PA301 and PA101 - Photoacoustic Acc
Page 132 and 133:
Semiconductor Applications - FTIR S
Page 134 and 135:
UV-Vis AccessoriesThis is the most
Page 136 and 137:
O R D E R I N G I N F O R M A T I O
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UV-Vis Spec -Slide Mounted Specular
Page 140 and 141:
UV-Vis VeeMAX -Variable Angle Specu
Page 142 and 143:
Peltier-Controlled Cuvette Holders
Page 144 and 145:
Automated XY, R-Theta and Y-rotatio
Page 146 and 147:
Standards, Softwareand DatabasesWe
Page 148 and 149:
For diffuse reflectance measurement
Page 150 and 151:
PIKECalc Software -For FTIR Samplin
Page 152 and 153:
Transmission Spectral Databases -Hi
Page 154 and 155:
HHand Press 95HATR 5, 17, 18, 19, 2
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Part Number Index007-0200 PIKE Temp
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026-2003 GladiATR Liquid Jacketed S
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121-1500 UV-Vis 15Spec 131121-2000
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160-5218 38 x 3 mm Polyethylene 104
Page 164 and 165:
ORDERING TERMS,CONTACT INFORMATIONA
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FTIR INSTRUMENT CODEXXABB BomemFTLA
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