Catalog - PIKE Technologies

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Quantitative measurement of active ingredient in a mixture of magnesiumstearate, lactose, EMCOMPRESS®, cellulose and CAB-O-SIL ®NIR IntegratIR with optional transmission tablet analyzerThe NIR IntegratIR comes complete with diffuse gold reference,sample holders and a removable general-purpose sample mountingplate. The NIR IntegratIR is configured for each specific FTIRspectrometer and includes a pre-aligned mount for your instrument.The NIR IntegratIR is a cost-effective, high-performancesampling option for laboratories with a standard FTIR spectrometerequipped with a near-infrared light source and beam splitter.The optional transmission tablet analysis stage for the NIRIntegratIR provides an automated tool for sampling 10 tablets ofa variety of sizes. With this option you can measure formulationreproducibility or verify pharmaceutical composition.P A R T N U M B E R048-60XXO R D E R I N G I N F O R M A T I O ND E S C R I P T I O NNIR IntegratIR Integrating Sphere AccessoryIncludes 2" diffuse gold-coated integrating sphere, InGaAsdetector, detector preamplifier, cable and baseplate for thespecific model spectrometer. The accessory also includes agold reference standard, vial holder, and 25 glass vials.Notes: Please see the FTIR instrument code sheet. Your spectrometer must becapable of interfacing with an external detector.Sampling Options for NIR IntegratIRP A R T N U M B E RD E S C R I P T I O N048-2999 Glass Sample Vials (Pack of 25), 19 x 65 mm048-3000 Diffuse Gold Reference048-3070 NIST Traceable NIR Reference Standard048-3071 NIST Traceable NIR Reference Standard – Recertification044-3010 Glass Vial Holder (for 19 mm vials)048-0150 Rotating Stage for Petri Dish (for heterogeneous samples)Includes 100 x 20 mm Petri Dish048-0151 Rotating Stage Adapter for 500 mL beaker048-0060 Automated Transmission Tablet Analysis Stage forNIR IntegratIRIncludes 3 tablet plates for 7.5, 8.5 and 10 mm tabletsNote: Please contact us for other options. Stage rotates counterclockwise.I N T E G R A T I N G S P H E R E S – R E F L E C T A N C E F R O M A L L P E R S P E C T I V E S61
P I K E T E C H N O L O G I E S W W W . P I K E T E C H . C O M 6 0 8 - 2 7 4 - 2 7 2 1Integrating Spheres – Introduction and TheoryMeasuring Sample ReflectanceReflectance sampling accessories rely upon a light beam comingfrom the spectrometer to be focused upon the sample. In orderto achieve the best signal-to-noise ratio (SNR), the smaller thefocus is, the easier it is to refocus the illuminated sample spotback onto the detector. In order to measure light reflected at alarger angle, optical designs will allow only a small area of thesample to be projected onto the detector. This arrangementserves well if the sample is microscopically homogeneous, butwill result in a larger sample position error. When the sample ismoved, the focused beam will see a different portion of the sampleresulting in measurement-to-measurement differences. This iscalled insertion error because the spectrum will be slightlydifferent each time the sample is inserted.Some industrial or natural samples are inhomogeneouseither because they are mixtures of different substances orbecause they have a particle size comparable to the probingbeam diameter. Clearly, if the probing beam could be larger andthe reflected light could all be collected, a more representativespectrum could be measured.Some other samples develop a directional scattering. Forexample, fibers wound on a mandrel are highly oriented, not justmacroscopically as parallel, unidirectional filaments, but also inmany cases the molecules of the drawn fibers are oriented withinthe fiber itself. Such a sample, when placed in a reflectanceaccessory will generate different results depending on the anglefrom which the detector is “viewing” the sample. When the overallreflectance needs to be measured reproducibly, for example tomeasure the concentration of a minor ingredient in the sample,only isotropic optical systems, insensitive to such directionalitiescould be utilized.Furthermore, in some cases, not just the reflectance in asmall solid angle but the reflectance in all angles is sought. Mostreflectance accessories measure at fixed or variable angles, narroweror wider collection angles, but there is a need for a devicethat uniformly collects all reflected light from a sample. In otherwords it measures the total reflectance of the sample.Therefore the main reasons for using integrating spheres forthe measurement of sample reflectance are the following:• Efficient measurement of combined diffuse and specularreflectance• Uniform detection of reflectance even when sample isinhomogeneous• Isotropic detection of reflectance even on samples that reflectin preferred directions• Reduction of polarization effects from the illuminating beamand the sample• Measurement of absolute reflectance (with specialintegrating spheres)All of the above concerns are addressed with integratingsphere based reflectometers.Integrating Sphere OpticsIntegrating spheres are highly reflective enclosures that areplaced in close proximity to the sample, such that the reflectedlight enters the sphere, bounces around the highly reflectivediffuse surface of the sphere wall and finally impinges upon thedetector – usually part of the integrating sphere assembly. Thename, integrating sphere, refers to one of the main functions ofthe device, namely that it spatially integrates the light flux, in ourapplication the light reflected from a sample. In spite of the longhistory of engineering and development of the sphere, the applicationsand further developments continue to this day. Advancesin the theory, detector and electronics development and most ofall, new applications, drive the progress.As the name implies, the main part of the device is a spherewith a very highly reflecting inner surface. The surface shouldapproach the ideal Lambertian scatterer, which means that thelight falling on the surface is evenly scattered in all directions andthe scattered light intensity is proportional to the cosine of theangle of observation.EntrancePort (A e )ρ wSampleArea ofSurface (A s )Optical geometry of an integrating sphereSamplePort (A s )F.O.V.BaffleDetectorPort (A d )In an upward sample positioning sphere the infrared beamfrom the interferometer is directed through an entrance portonto the sample placed behind the sample port (shown above).Samples can be directly touching the sphere or separated fromthe sphere by a thin, infrared transparent window. The detectoris placed close to the sphere, so that it can view the integratingsphere with a large solid angle. In order to improve the isotropy(non-directionality) of the detection, the detector is not directly inthe line of sight of the sample. A small, also highly reflective andscattering baffle is placed in the sphere such that it blocks thefirst reflection of the sample from reaching the detector.62
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The PIKE Technologies team looksfor
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TA B L E O F C O N T E N T SPages 1
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Pages 81-114Transmission Sampling -
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Sampling KitsIf you are not sure wh
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Comprehensive Transmission Sampling
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Valu-Line - High Performance Set of
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Attenuated Total ReflectanceATR pro
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MIRacle Crystal OptionsThe MIRacle
Page 18 and 19: MIRacle Base Optics (must select, i
Page 20 and 21: Selection of the digital control mo
Page 22 and 23: G L A D IATR V I S I O N A C C E S
Page 24 and 25: Multiple Reflection HATR -Maximum S
Page 26 and 27: A large number of temperature-contr
Page 28 and 29: ATRMax II Variable Angle Horizontal
Page 30 and 31: ATRMax II System ConfigurationsPA R
Page 32 and 33: Spectroelectrochemical cell with re
Page 34 and 35: JetStream ATR Accessory -Measuremen
Page 36 and 37: ATR - Theory and ApplicationsAttenu
Page 38 and 39: Porous Foam Sample with High Pressu
Page 40 and 41: Diffuse ReflectanceDiffuse reflecta
Page 42 and 43: DiffusIR -Research Grade Diffuse Re
Page 44 and 45: UpIR -Upward Looking Diffuse Reflec
Page 46 and 47: X, Y Autosampler - Transmission and
Page 48 and 49: Diffuse Reflectance - Theory and Ap
Page 50 and 51: Specular ReflectanceSpecular reflec
Page 52 and 53: Changing the angle of incidence wit
Page 54 and 55: 80Spec -Grazing Angle Specular Refl
Page 56 and 57: 10Spec -Near-normal Sample Reflecti
Page 58 and 59: Specular Reflectance - Theory and A
Page 60 and 61: PolarizationPolarizers may be used
Page 62 and 63: Infrared Polarizers - Theory and Ap
Page 64 and 65: Integrating SpheresIntegrating sphe
Page 66 and 67: A selection of Mercury cadmium tell
Page 70 and 71: A well-designed sphere has the samp
Page 72 and 73: Remote SamplingAccessoriesHollow wa
Page 74 and 75: F L E XIR A C C E S S O RY S P E C
Page 76 and 77: Heated Liquid Sample Holder -Charac
Page 78 and 79: MicrosamplingMicrosampling accessor
Page 80 and 81: Switching from transmission to refl
Page 82 and 83: Compact Transmission/Reflection S84
Page 84 and 85: Micro Diamond Cell -For Compressing
Page 86 and 87: Beam CondensersP A R T N U M B E R0
Page 88 and 89: Transmission SamplingTransmission s
Page 90 and 91: RotatIR -Automated Rotating Sample
Page 92 and 93: X, Y Autosampler - Transmission and
Page 94 and 95: Demountable Liquid Cells -For Versa
Page 96 and 97: Long-Path Quartz Liquid Cells -For
Page 98 and 99: Demountable Liquid Cell Windows(mus
Page 100 and 101: Cryostat190 - Ultralow Temperature
Page 102 and 103: Bolt Press & Hydraulic Die - Low-Co
Page 104 and 105: Heated Platens Accessory - For Maki
Page 106 and 107: Auto-CrushIR -Programmable Hydrauli
Page 108 and 109: Sample Preparation Accessories -For
Page 110 and 111: Disks, Windows and Powders -For Tra
Page 112 and 113: Disks, 41 mm Diameter3 mm Thickness
Page 114 and 115: Short-Path Gas Cells -For Samples w
Page 116 and 117: Long-Path Gas Cells -For Measuremen
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Transmission Sampling Techniques -
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An alternate method for analysis of
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Special ApplicationsPIKE Technologi
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MappIR and MAP300 -For Automated An
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TGA/FTIR Accessory - Identification
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GC-FTIR Accessory -Combining GC Sep
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PA301 and PA101 - Photoacoustic Acc
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Semiconductor Applications - FTIR S
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UV-Vis AccessoriesThis is the most
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O R D E R I N G I N F O R M A T I O
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UV-Vis Spec -Slide Mounted Specular
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UV-Vis VeeMAX -Variable Angle Specu
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Peltier-Controlled Cuvette Holders
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Automated XY, R-Theta and Y-rotatio
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Standards, Softwareand DatabasesWe
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For diffuse reflectance measurement
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PIKECalc Software -For FTIR Samplin
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Transmission Spectral Databases -Hi
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HHand Press 95HATR 5, 17, 18, 19, 2
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Part Number Index007-0200 PIKE Temp
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026-2003 GladiATR Liquid Jacketed S
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121-1500 UV-Vis 15Spec 131121-2000
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160-5218 38 x 3 mm Polyethylene 104
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ORDERING TERMS,CONTACT INFORMATIONA
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FTIR INSTRUMENT CODEXXABB BomemFTLA
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