Catalog - PIKE Technologies

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Specular ReflectanceSpecular reflectance is an excellent samplingtechnique for measurement of thin films onreflective substrates and for non-invasive analysisof samples. The specular reflectance spectrum maybe used for sample identification, for quality controlof coated materials, for analysis of monolayers andfor film thickness measurement.PIKE Technologies offers several versions ofspecular reflectance accessories to addressapplications from research to quality control.Page 44VeeMAXResearch Grade SpecularReflectance Accessory – withvariable angle of incidencePage 4630SpecFixed angle Specular Reflectance –for relatively thick filmsPage 4780SpecAnalysis of monolayers andother relatively thin filmsPage 48AGA80 degree Specular Reflectancewith precise control of sampling sizePage 4910SpecFixed 10 degree specular forE1585-93 reflectance methodPage 50Absolute Reflectance AccessorySpecular Reflection Accessory –to measure sample reflectivityPage 51Specular ReflectanceTheory and Applications
P I K E T E C H N O L O G I E S W W W . P I K E T E C H . C O M 6 0 8 - 2 7 4 - 2 7 2 1VeeMAX III –The Ultimate Variable Angle Specular Reflectance AccessoryF E A T U R E S O F T H E V E E M A X I I I• Selectable angle of incidence – from 30 to 80 degrees in onedegree increments• Measurement of thin films and monolayers to relativelythick films• Optimize specular reflectance results with selectable angleof incidence• Integrated position for IR polarization – essential formonolayer analysis and study of sample orientation• Optional single reflection ATR crystals – see ATR section• Motorized version option with electronic control module andAutoPRO software for automated, high-precision experiments• Sealed and purgeable optical design to eliminate watervapor and carbon dioxide interferencesThe PIKE Technologies VeeMAX III is a high performance and highlyversatile specular reflectance accessory designed to analyze awide range of samples. From monolayers to relatively thick films,the VeeMAX III with variable angle of incidence can be optimizedfor all specular applications. The unique optical design of thisproduct (U.S. Patent No. 5,106,196) enables the accessory to be inalignment for all angles of incidence. The angle may be variedcontinuously from thirty to eighty degrees by the rotation of asingle control. The sample is placed face down on the samplingsurface. Because of the unrestricted access to the sampling area,large samples may be readily analyzed. To suit different samplinggeometries, masks with 2", 5/8" and 3/8" apertures are provided.Thanks to the optical design of this accessory, excellent throughputis available even at high angles of incidence. The VeeMAX III has abuilt-in polarizer mount to permit selection of polarization anglewithout disturbing purge.An optional motorized version of the accessory is available. Itfeatures a stepper motor with complementary electronics, MotionControl Unit, and PIKE Technologies AutoPRO software. In thiscombination, operation of the VeeMAX III can be integrated withthe spectrometer software, which allows the operator to preciselyand reliably control a wide range of angles of incidence and datacollection simultaneously from the computer keyboard.Proprietary beam path within the VeeMAX III Specular Reflectance accessoryOptimization of the analysis of a multi-layered coating on metalsubstrate using the VeeMAX III44
Page 2 and 3: The PIKE Technologies team looksfor
Page 4 and 5: TA B L E O F C O N T E N T SPages 1
Page 6 and 7: Pages 81-114Transmission Sampling -
Page 8 and 9: Sampling KitsIf you are not sure wh
Page 10 and 11: Comprehensive Transmission Sampling
Page 12 and 13: Valu-Line - High Performance Set of
Page 14 and 15: Attenuated Total ReflectanceATR pro
Page 16 and 17: MIRacle Crystal OptionsThe MIRacle
Page 18 and 19: MIRacle Base Optics (must select, i
Page 20 and 21: Selection of the digital control mo
Page 22 and 23: G L A D IATR V I S I O N A C C E S
Page 24 and 25: Multiple Reflection HATR -Maximum S
Page 26 and 27: A large number of temperature-contr
Page 28 and 29: ATRMax II Variable Angle Horizontal
Page 30 and 31: ATRMax II System ConfigurationsPA R
Page 32 and 33: Spectroelectrochemical cell with re
Page 34 and 35: JetStream ATR Accessory -Measuremen
Page 36 and 37: ATR - Theory and ApplicationsAttenu
Page 38 and 39: Porous Foam Sample with High Pressu
Page 40 and 41: Diffuse ReflectanceDiffuse reflecta
Page 42 and 43: DiffusIR -Research Grade Diffuse Re
Page 44 and 45: UpIR -Upward Looking Diffuse Reflec
Page 46 and 47: X, Y Autosampler - Transmission and
Page 48 and 49: Diffuse Reflectance - Theory and Ap
Page 52 and 53: Changing the angle of incidence wit
Page 54 and 55: 80Spec -Grazing Angle Specular Refl
Page 56 and 57: 10Spec -Near-normal Sample Reflecti
Page 58 and 59: Specular Reflectance - Theory and A
Page 60 and 61: PolarizationPolarizers may be used
Page 62 and 63: Infrared Polarizers - Theory and Ap
Page 64 and 65: Integrating SpheresIntegrating sphe
Page 66 and 67: A selection of Mercury cadmium tell
Page 68 and 69: Quantitative measurement of active
Page 70 and 71: A well-designed sphere has the samp
Page 72 and 73: Remote SamplingAccessoriesHollow wa
Page 74 and 75: F L E XIR A C C E S S O RY S P E C
Page 76 and 77: Heated Liquid Sample Holder -Charac
Page 78 and 79: MicrosamplingMicrosampling accessor
Page 80 and 81: Switching from transmission to refl
Page 82 and 83: Compact Transmission/Reflection S84
Page 84 and 85: Micro Diamond Cell -For Compressing
Page 86 and 87: Beam CondensersP A R T N U M B E R0
Page 88 and 89: Transmission SamplingTransmission s
Page 90 and 91: RotatIR -Automated Rotating Sample
Page 92 and 93: X, Y Autosampler - Transmission and
Page 94 and 95: Demountable Liquid Cells -For Versa
Page 96 and 97: Long-Path Quartz Liquid Cells -For
Page 98 and 99: Demountable Liquid Cell Windows(mus
Page 100 and 101:
Cryostat190 - Ultralow Temperature
Page 102 and 103:
Bolt Press & Hydraulic Die - Low-Co
Page 104 and 105:
Heated Platens Accessory - For Maki
Page 106 and 107:
Auto-CrushIR -Programmable Hydrauli
Page 108 and 109:
Sample Preparation Accessories -For
Page 110 and 111:
Disks, Windows and Powders -For Tra
Page 112 and 113:
Disks, 41 mm Diameter3 mm Thickness
Page 114 and 115:
Short-Path Gas Cells -For Samples w
Page 116 and 117:
Long-Path Gas Cells -For Measuremen
Page 118 and 119:
Transmission Sampling Techniques -
Page 120 and 121:
An alternate method for analysis of
Page 122 and 123:
Special ApplicationsPIKE Technologi
Page 124 and 125:
MappIR and MAP300 -For Automated An
Page 126 and 127:
TGA/FTIR Accessory - Identification
Page 128 and 129:
GC-FTIR Accessory -Combining GC Sep
Page 130 and 131:
PA301 and PA101 - Photoacoustic Acc
Page 132 and 133:
Semiconductor Applications - FTIR S
Page 134 and 135:
UV-Vis AccessoriesThis is the most
Page 136 and 137:
O R D E R I N G I N F O R M A T I O
Page 138 and 139:
UV-Vis Spec -Slide Mounted Specular
Page 140 and 141:
UV-Vis VeeMAX -Variable Angle Specu
Page 142 and 143:
Peltier-Controlled Cuvette Holders
Page 144 and 145:
Automated XY, R-Theta and Y-rotatio
Page 146 and 147:
Standards, Softwareand DatabasesWe
Page 148 and 149:
For diffuse reflectance measurement
Page 150 and 151:
PIKECalc Software -For FTIR Samplin
Page 152 and 153:
Transmission Spectral Databases -Hi
Page 154 and 155:
HHand Press 95HATR 5, 17, 18, 19, 2
Page 156 and 157:
Part Number Index007-0200 PIKE Temp
Page 158 and 159:
026-2003 GladiATR Liquid Jacketed S
Page 160 and 161:
121-1500 UV-Vis 15Spec 131121-2000
Page 162 and 163:
160-5218 38 x 3 mm Polyethylene 104
Page 164 and 165:
ORDERING TERMS,CONTACT INFORMATIONA
Page 166 and 167:
FTIR INSTRUMENT CODEXXABB BomemFTLA
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Catalog - PIKE Technologies

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