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NTEGRA Spectra - NT-MDT

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Tip Enhanced Raman Scattering (TERS)A route to Raman microscopy with subwavelength spatialresolution and single molecule sensitivityTERS – “inverted” SERS effect (scanning metal tip is a HOT SPOT)Metal AFM probeElectromagnetic fieldintensity aroundmetal tip2RR)200-600 nmEnhanced RamansignalFocused laser spot<strong><strong>NT</strong>EGRA</strong> <strong>Spectra</strong>

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