NTEGRA Spectra - NT-MDT

ALL major AFM modes are integrated with RAMANNT-MDT Standard Measuring modesMore than 30 possible different AFM modesINTEGRATED with Raman-Confocal• STM• Contact AFM• Lateral Force Microscopy• Resonant Mode -Semicontact• Noncontact AFM mode• Phase Imaging• Force Modulation (viscoelastisity)• Magnetic force Microcopy• Electrostatic Force Microscopy• Adhesion Force Imaging• AFM Lithography-Force• Spreading Resistance Imaging (SRI) in Currents 30fA-50nA• AFM Nanolitogrphy (voltage and scratching)• Scanning Capacitance Imaging (SCI) (dC/dZ, dC/dV)• Scanning Kelvin probe microscopy (SKM)• Force distance curves• Force Volume• Nanomanipulation• Piezoresponce Mode• Sample heating for in-situ melting• I/V spectroscopy, I(Z) spectroscopy etc.• Electrochemistryt• SNOM• ….SPM PROBES:- AFM cantilever (any type)- STM- tuning fork (shear force)- tuning fork (normal force)