Intel 45nm Process Overview - UCSB CAD & Test
Intel 45nm Process Overview - UCSB CAD & Test
Intel 45nm Process Overview - UCSB CAD & Test
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Defect Reduction Trend<br />
• Mature yield demonstrated 2 years after 65 nm<br />
Defect<br />
Density<br />
(log scale)<br />
130 nm 90 nm 65 nm 45 nm<br />
2000 2001 2002 2003 2004 2005 2006 2007 2008