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Exploration and Optimization of Tellurium‐Based Thermoelectrics

Exploration and Optimization of Tellurium‐Based Thermoelectrics

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12.3.2. Electronic Structure Calculations<br />

In all studied cases, the space group was set to 4/ corresponding to the closest space group<br />

to 4/ where no further symmetry is lost by substituting Sn <strong>and</strong> Bi atoms on Tl sites. Due to the<br />

lack <strong>of</strong> Te–Te bonds in the system, the Te atoms can be considered Te 2‐ , while the other atoms can be<br />

treated as the typical Tl + , Sn 2+ <strong>and</strong> Bi 3+ . This is the same approach taken with literature calculations as<br />

well as those found previously in this section. The calculations in Tl10‐xLaxTe6 [236] utilized a similar<br />

strategy to these calculations <strong>and</strong> also resulted in p‐type <strong>and</strong> metallic results.<br />

Figure 12.1 DOS calculations for Tl 9Sn 1‐xBi xTe 6: Tl 8.5SnBi 0.5Te 6 (left), Tl 9Sn 0.5Bi 0.5Te 6 (centre), Tl 8.5Sn 0.5BiTe 6 (right)<br />

The Sn‐heavy model was calculated by replacing one more Tl site with a Sn atom wielding Tl8.5Sn1Bi0.5Te6,<br />

an intrinsic semiconductor with a b<strong>and</strong> gap on the order <strong>of</strong> 0.2 eV with a similar appearance to the<br />

ternary itself, shown in Figure 10.2; the density <strong>of</strong> states (DOS ) calculated for x = 0.5, y = 0.5 predicts p‐<br />

type extrinsic semiconductor behaviour with an electron deficiency <strong>of</strong> ~ 0.15 eV below the b<strong>and</strong> gap,<br />

which is then predicted to be on the order <strong>of</strong> 0.3 eV; the Bi‐rich model, Tl8.5Sn0.5Bi1Te6, is predicted to<br />

show metallic behaviour as it has no gap between valence <strong>and</strong> conduction b<strong>and</strong>s. The valence b<strong>and</strong> is<br />

predominantly occupied by Te‐p states.<br />

12.3.3. Physical Property Measurements<br />

12.3.3.1. Tl9Sn1‐xBixTe6<br />

The Seebeck coefficient for Tl9Sn1‐xBixTe6 displays behaviour typical <strong>of</strong> p‐type semiconductors<br />

with a reasonably high charge carrier concentration. Seebeck coefficient values increase steadily across<br />

the full range <strong>of</strong> temperature measurement in a constant <strong>and</strong> linear fashion. The lowest Seebeck<br />

coefficient values correspond to Tl9Sn0.8Bi0.2Te6 with 41 V∙K ‐1 at room temperature <strong>and</strong> increases to 77<br />

132

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