Scientific Advisory Board - Erich Schmid Institute
Scientific Advisory Board - Erich Schmid Institute
Scientific Advisory Board - Erich Schmid Institute
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ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE<br />
12. dehm gerhard<br />
“Small is Strong” - towards a quantitative understanding of deformation<br />
behavior at the micro- and nano-scale .<br />
dgK2011 / deutsche gesellschaft für Kristallographie / 19th Annual meeting<br />
(deutsche mineralogische gesellschaft), Salzburg/AUStRiA, 21.09.2011<br />
13. fischer franz dieter, Simha n.K., predan J., Schöngrundner R., Kolednik otmar<br />
On configurational forces at boundaries in fracture mechanics .<br />
5th international Symposium on defect and material mechanics, iSdmm11, Seville/<br />
SpAin, 29.06.2011<br />
14. fischer franz dieter, clemens Helmut, dehm gerhard, Kirchlechner christoph,<br />
Rester martin, Schmoelzer t.<br />
Deformation Mechanisms in PST-TiAl Micor-Pillars-Experiment and Modelling .<br />
euromat 2011 (the federation of european materials Society (femS)), montpellier/<br />
fRAnce, 12.09.2011<br />
15. Keckes Jozef<br />
Structural properties of thin films and small structures characterized by<br />
synchrotron X-ray diffraction .<br />
colloquium department of Applied physics and Applied mathematics (columbia<br />
University), new York/United StAteS, 15.07.2011<br />
16. Keckes Jozef<br />
Position-Resolved X-ray Micro- and Nano-Beam Characterization of<br />
Microstructure and Residual Stresses .<br />
Size-Strain Vi “diffraction Analysis of the microstructure of materials” (institut<br />
matériaux microélectronique nanosciences de provence UmR6242 cnRS),<br />
presqu’île de giens, Hyères/fRAnce, 18.10.2011<br />
17. Keckes Jozef<br />
Thermo-Mechanical Behavior of Thin Films and Small Structures Characterized<br />
by Synchrotron X-ray Diffraction .<br />
colloquium deSY Berlin (deSY Berlin), Berlin/geRmAnY, 30.06.2011<br />
18. Kiener daniel, dehm gerhard<br />
Obtaining a quantitative micro- and nano-mechanical understanding of metals<br />
using in situ electron microscopy .<br />
mcm 2011 / 10th multinational congress on microscopy (<strong>Scientific</strong> campus Urbino<br />
University “carlo Bo”), Urbino/itALY, 06.09.2011<br />
19. Kiener daniel, Kirchlechner christoph, Zhang Zaoli, Sturm S., Ulrich o., micha J.S.,<br />
dehm gerhard<br />
Plasticity of FIB fabricated microsamples investigated by in-situ micro-Laue<br />
diffraction and in-situ TEM .<br />
mcm 2011 / 10th multinational congress on microscopy (<strong>Scientific</strong> campus Urbino<br />
University “carlo Bo”), Urbino/itALY, 07.09.2011<br />
page 58 <strong>Scientific</strong> RepoRt 2012
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