25.08.2013 Views

development of micro-pattern gaseous detectors – gem - LMU

development of micro-pattern gaseous detectors – gem - LMU

development of micro-pattern gaseous detectors – gem - LMU

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

58 Chapter 5 Efficiency Determination<br />

photomultiplier<br />

scintillator 1<br />

GEM<br />

scintillator scintillator 22<br />

photomultiplier photomultiplier<br />

z<br />

Sc 2<br />

GEM<br />

MC Simulation θ<br />

ϕ<br />

Sc 1<br />

Figure 5.1: Schematics <strong>of</strong> the defined layers for simulation.<br />

Normalizing this vector with respect to the z-axis defines the vector check[i] and i ∈ [0, 1, 2] :<br />

check[i] = direc[i]<br />

direc[2]<br />

Starting with the detection point posz at the lower scintillator, the check-vector is extrapolated to the<br />

upper scintillators lower and upper surfaces, respectively.<br />

If the endpoint <strong>of</strong> the track lays within the respective rectangle (see Fig. 5.2), the muon has crossed<br />

also the upper scintillator and will be tagged as an ”upper scintillator hit”. The same method can be<br />

applied to checking if this muon also hit the GEM detector. Then it is tagged as a ”GEM hit” muon.<br />

Figure 5.2: Cross section <strong>of</strong> the simulation model. The starting point <strong>of</strong> muons is on the lower scintillator Sc1.<br />

Running this procedure for a large number <strong>of</strong> simulated events and taking the ratio <strong>of</strong> “GEM hits” over<br />

“upper scintillator hits”, one receives the geometrical correction factor fcorr that has to be inserted in<br />

the efficiency calculation:<br />

Sc 2<br />

GEM<br />

Sc 1<br />

ϕ<br />

x<br />

(5.3)

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!