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Theory, Design and Tests on a Prototype Module of a Compact ...

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52 4. CIRCUIT MODEL<br />

<str<strong>on</strong>g>and</str<strong>on</strong>g> if N → ∞, namely the chain is infinite, i ′ also goes to the infinity,<br />

tanh i ′ x = 1 <str<strong>on</strong>g>and</str<strong>on</strong>g> therefore<br />

Vci<br />

Vci+1<br />

=<br />

1<br />

cosh x + sinh x<br />

= 1<br />

λ1<br />

= λ2<br />

(4.28)<br />

Therefore, we obtain that the ratio is equal to the eigenvalue λ2 <strong>of</strong> the<br />

transmissi<strong>on</strong> matrix T . It is worth noting that this could be a way to<br />

obtain the dispersi<strong>on</strong> diagram for an infinite chain <str<strong>on</strong>g>and</str<strong>on</strong>g> it is interesting<br />

that this c<strong>on</strong>cept is related to the eigenvalues <strong>of</strong> the transmissi<strong>on</strong><br />

matrix.<br />

2. The perturbed transmissi<strong>on</strong> matrix<br />

This secti<strong>on</strong> deals with the case <strong>of</strong> a chain <strong>of</strong> equivalent circuits<br />

with different lumped parameters, i.e. the inductances <str<strong>on</strong>g>and</str<strong>on</strong>g> capacitances<br />

depend from the cavities.<br />

This situati<strong>on</strong> represents the realistic case <strong>of</strong> finite machining tolerance<br />

<str<strong>on</strong>g>and</str<strong>on</strong>g> errors for the copper tiles c<strong>on</strong>taining two coupled half cells.<br />

Such errors lead to a different res<strong>on</strong>ant frequency <str<strong>on</strong>g>and</str<strong>on</strong>g> a different shunt<br />

impedance for each half cell <str<strong>on</strong>g>and</str<strong>on</strong>g> could be interesting to find a c<strong>on</strong>necti<strong>on</strong><br />

between the machining tolerances <str<strong>on</strong>g>and</str<strong>on</strong>g> the reachable relevant parameters<br />

<strong>of</strong> the whole chain that are the π/2-mode res<strong>on</strong>ant frequency<br />

<str<strong>on</strong>g>and</str<strong>on</strong>g> the axial field.<br />

In the equivalent model these errors are schematized by a shift in<br />

the res<strong>on</strong>ant frequency ω0 becoming ω0 + δω0i for each cavity.<br />

2.1. The perturbed transmissi<strong>on</strong> matrix for <strong>on</strong>e cell. Let<br />

us c<strong>on</strong>sider the single two-ports shown in figure 4.3, which is composed<br />

by two half cavities <str<strong>on</strong>g>and</str<strong>on</strong>g> where i is the two-ports index.<br />

Figure 4.3. The two-ports representing two coupled<br />

half cavities with different parameters.<br />

The machining tolerances are represented by errors in the cavity<br />

inductance <str<strong>on</strong>g>and</str<strong>on</strong>g> capacitance which are different for the left <str<strong>on</strong>g>and</str<strong>on</strong>g> right

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