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PHYS01200804001 Sohrab Abbas - Homi Bhabha National Institute

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with a white, and hence high-intensity, incident neutron beam, enabling a fast and precise<br />

measurement due to the improved (in fact, FULL) interference contrast.<br />

A dual sample of thickness D each inserted in both gaps of path I (or path II) of the IFM with its<br />

surfaces aligned parallel to the IFM Bragg planes yields an exactly non-dispersive phase given by<br />

<br />

1 Nb N b 1<br />

<br />

c a a<br />

I<br />

II 4D ,<br />

2<br />

4d 2d <br />

<br />

<br />

(91)<br />

and the phase difference between path I and II equals,<br />

<br />

1 Nb N b 1<br />

<br />

c a a<br />

III 8D .<br />

2<br />

4d 2d <br />

<br />

<br />

(92)<br />

Fig.56 Dual Si-sample mounted on a plate.<br />

104

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