As and Epitaxial-Growth MnSi Thin Films - OPUS Würzburg

130
[Brin 70] W. Brinkman, R. Dynes, and J. Rowell. Journal of applied physics, Vol. 41,
No. 5, pp. 1915–1921, 1970.
[Bute 10] A. B. Butenko, A. A. Leonov, U. K. Rler, and A. N. Bogdanov. Phys. Rev.
B, Vol. 82, No. 5, pp. 052403–, 2010.
[Camp 82] I. Campbell and A. Fert. Vol. 3North-Holland, Amsterdam, p. 747, 1982.
[Cane 00] C.Canedy, H.Li, S.Alpay, L.Salamanca-Riba, A. Roytburd, andR.Ramesh.
Applied Physics Letters, Vol. 77, p. 1695, 2000.
[Cham 01] S. Chambers, Y. Liang, Z. Yu, R. Droopad, and J. Ramdani. Journal of
Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 19,
No. 3, pp. 934–939, 2001.
[Chib 03] D. Chiba, M. Yamanouchi, F. Matsukura, and H. Ohno. Science, Vol. 301,
No. 5635, pp. 943–945, 2003.
[Chib 04] D. Chiba, Y. Sato, T. Kita, F. Matsukura, and H. Ohno. Phys. Rev. Lett.,
Vol. 93, No. 21, pp. 216602–, 2004.
[Chib 06a] D. Chiba. Applied Physics Letters, Vol. 89, No. 16, pp. 162505–, 2006.
[Chib 06b] D. Chiba, M. Yamanouchi, F. Matsukura, T. Dietl, and H. Ohno. Phys. Rev.
Lett., Vol. 96, No. 9, pp. 096602–, 2006.
[Chib 08] D.Chiba, M.Sawicki, Y.Nishitani, Y.Nakatani, F.Matsukura, andH.Ohno.
Nature, Vol. 455, No. 7212, pp. 515–518, 2008.
[Diet 00] T.Dietl, H.Ohno, F.Matsukura, J.Cibert, andD.Ferrand. Science,Vol.287,
No. 5455, pp. 1019–1022, 2000.
[Diet 01a] T. Dietl. Journal of Applied Physics, Vol. 89, No. 11, pp. 7437–, 2001.
[Diet 01b] T. Dietl, H. Ohno, and F. Matsukura. Phys. Rev. B, Vol. 63, No. 19,
pp. 195205–, 2001.
[Diet 08] T. Dietl. Journal of Applied Physics, Vol. 103, No. 7, pp. 07D111–, 2008.
[Diet 13] T. Dietl and H. Ohno. arXiv preprint arXiv:1307.3429, 2013.
[Duan 08] C.-G. Duan, J. P. Velev, R. F. Sabirianov, W.-N. Mei, S. S. Jaswal, and E. Y.
Tsymbal. Applied Physics Letters, Vol. 92, No. 12, pp. 122905–122905, 2008.
[Dzya 58] I. Dzyaloshinsky. Journal of Physics and Chemistry of Solids, Vol. 4, No. 4,
pp. 241–255, 1958.
[Dzya 64] I. Dzyaloshinskii. Sov. Phys. JETP, Vol. 19, pp. 960–971, 1964.
[Edmo 02] K. Edmonds. Applied Physics Letters, Vol. 81, No. 26, pp. 4991–, 2002.