Debris and Edge Excursions - Semiconductor Wafer Test Workshop
Debris and Edge Excursions - Semiconductor Wafer Test Workshop
Debris and Edge Excursions - Semiconductor Wafer Test Workshop
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Method 1 – No <strong>Debris</strong> Filters<br />
Inspection<br />
Results:<br />
10x<br />
Inspection<br />
Time:<br />
Total number<br />
of defects:<br />
10 minutes<br />
30 seconds<br />
7100<br />
Approximate<br />
Review Time:<br />
1 hours 10<br />
minutes
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