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FINFET Isolation Approaches and Ramifications - SOI Industry ...

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IBM Semiconductor Research <strong>and</strong> Development Center<br />

Electrostatics<br />

“Conventional”<br />

FD<strong>SOI</strong><br />

FinFET<br />

Λ<br />

S<br />

Gate<br />

D<br />

Λ/2<br />

S<br />

Gate<br />

BOX<br />

Substrate<br />

D<br />

S<br />

Gate<br />

Gate<br />

D<br />

Λ<br />

Λ = t dep +ε si /ε ox t ox<br />

L ~ 1/√N<br />

• Confinement of field<br />

lines by doping<br />

Λ = 2(t si +ε si /ε ox t ox )<br />

L min ~ 3t si +9t ox<br />

• Confinement of field<br />

lines by BOX<br />

Λ = t si +ε si /ε ox 2t ox<br />

L min ~ 1.5t si +9t ox<br />

• Confinement of field<br />

lines by gates<br />

2004 IEEE <strong>SOI</strong> Short Course<br />

Huang & Nowak<br />

D. Frank, et al.<br />

FD<strong>SOI</strong> Workshop Hsinchu, Taiwan April 22, 2013

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