Johnstech International - BiTS Workshop

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Critical Factors of TestContacting▼ Reliability: Dependable performance▼ Repeatability: Successful similar resultseach and every time▼ Resolution: Measurable incrementaldifferencesJohnstech International3
Test System Issues forPoor OEE▼ Test system components leavesignificant room for error● Lower First Pass Yields● Decreased Throughput● System Jams● Overall Inefficient SetupJohnstech International4
Page 3 and 4: Presentations“Evaluation Of Test
Page 5 and 6: Agenda• Background• Requirement
Page 7 and 8: Requirement• 100% “Plug-n-Play
Page 9 and 10: Evaluation criteria (non-electrical
Page 11 and 12: Evaluation criteria (electrical)con
Page 13 and 14: Signal characteristicsAt 250 MHzOri
Page 15 and 16: JitteringAt 250 MHzOriginal socketS
Page 17 and 18: Signal distortionAt 250 MHzOriginal
Page 19 and 20: Parasitic component measurementSelf
Page 21 and 22: Parasitic component measurementSelf
Page 23 and 24: Evaluation criteria (reliability)
Page 25 and 26: Conclusionscont’d ….• This ri
Page 27: The Goal of SemiconductorManufactur
Page 31 and 32: Reliability▼ Loose alignment syst
Page 33 and 34: Reliability▼ Wide alignment patte
Page 35 and 36: Short Rigid ContactExampleReliabili
Page 37 and 38: Repeatability▼ If the device lead
Page 39 and 40: Repeatability▼ The elastomeric el
Page 41 and 42: Resolution▼ Generic contactors al
Page 43 and 44: Resolution▼ Correction is develop
Page 45 and 46: Conclusion▼ Semiconductor manufac
Page 47 and 48: Agenda:BiTS 2000 Presentation objec
Page 49 and 50: Introduction:BiTS 2000Types of Test
Page 51 and 52: BiTS 2000Example of tool to predict
Page 53 and 54: Life span of pogo pin is determined
Page 55 and 56: BiTS 2000ESD ConsiderationsIntroduc
Page 57 and 58: How ESD is build up on TestContacto
Page 59 and 60: BiTS 2000Alternate methods to reduc
Page 61: BiTS 2000Summary: Selection of cont

Johnstech International - BiTS Workshop

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