Johnstech International - BiTS Workshop

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Design considerations for cost& performance<strong>BiTS</strong> 2000Test contactor design requirements are driven by the CPU design, as today’shigh performance CPU requires high power and current but lower voltage. Test contactor material Good mechanical properties under test temperature of -55 o C - 150 o C low ESD ( with surface resistivity ideally within static dissipativematerial of 10 6 to 10 9 Ohms/Sq) machining tolerance of ± .001” in X-Y-Z directions (current 500-600pins, future >1K) High Strength,minimal warpage during testing (high speed test,
<strong>BiTS</strong> 2000Example of tool to predict the performance of test contactor materialFig 3. Displacement Vs LoadFig 4. Stress Vs LoadJCJCTanTanFebFeb20002000Intel ITTO Penang 6
Page 3 and 4: Presentations“Evaluation Of Test
Page 5 and 6: Agenda• Background• Requirement
Page 7 and 8: Requirement• 100% “Plug-n-Play
Page 9 and 10: Evaluation criteria (non-electrical
Page 11 and 12: Evaluation criteria (electrical)con
Page 13 and 14: Signal characteristicsAt 250 MHzOri
Page 15 and 16: JitteringAt 250 MHzOriginal socketS
Page 17 and 18: Signal distortionAt 250 MHzOriginal
Page 19 and 20: Parasitic component measurementSelf
Page 21 and 22: Parasitic component measurementSelf
Page 23 and 24: Evaluation criteria (reliability)
Page 25 and 26: Conclusionscont’d ….• This ri
Page 27 and 28: The Goal of SemiconductorManufactur
Page 29 and 30: Test System Issues forPoor OEE▼ T
Page 31 and 32: Reliability▼ Loose alignment syst
Page 33 and 34: Reliability▼ Wide alignment patte
Page 35 and 36: Short Rigid ContactExampleReliabili
Page 37 and 38: Repeatability▼ If the device lead
Page 39 and 40: Repeatability▼ The elastomeric el
Page 41 and 42: Resolution▼ Generic contactors al
Page 43 and 44: Resolution▼ Correction is develop
Page 45 and 46: Conclusion▼ Semiconductor manufac
Page 47 and 48: Agenda:BiTS 2000 Presentation objec
Page 49: Introduction:BiTS 2000Types of Test
Page 53 and 54: Life span of pogo pin is determined
Page 55 and 56: BiTS 2000ESD ConsiderationsIntroduc
Page 57 and 58: How ESD is build up on TestContacto
Page 59 and 60: BiTS 2000Alternate methods to reduc
Page 61: BiTS 2000Summary: Selection of cont

Johnstech International - BiTS Workshop

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