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Thesis - Instituto de Telecomunicações

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122 CHAPTER 6. APPLICATIONS AND RESULTS10 in a <strong>de</strong>nse matrix of numbers (see appendix B for a <strong>de</strong>tailed <strong>de</strong>scription of the test). Theconcentration test was selected given that it was the one that produced more EDA eventsin all users. For all the results with EDA standalone classification we used half the data fortraining and half the data for classification.In the fusion experiments, we created a synthetic data source with the same number ofclasses. The data mo<strong>de</strong>l was a multimodal normal N(µ, Σ) with µ i =[µ 1 , ··· ,µ nc ] whereµ j = 1 if j = i and µ j = 0 if j ≠ i otherwise (i is the class/user number). Σ is a diagonalmatrix with σ in each diagonal element. This mo<strong>de</strong>l creates a class space where the classmeans are equally spaced from each other, providing a classification error that is distributedamong all the classes. For this mo<strong>de</strong>l we just need to <strong>de</strong>fine the scalar σ that controls thedata separation. We used a σ that provi<strong>de</strong>d a base error for the synthetic classifier equalto 0.071.6.2.2 Feature AnalysisWe used only one of the extracted features, the one that provi<strong>de</strong>d the best classificationresults, namely the event amplitu<strong>de</strong>. This selection was done empirically, and in this casewe skipped the automatic features selection step. Observing the data, we noticed that thefeature skewness for every user was 2.81±1.1 (mean value for all users). This gives groundto assume that the normal mo<strong>de</strong>l does not fit the collected data well. Empirically, weobserved that taking the logarithm of the feature presented data with a distribution nearto the normal PDF (when measured, the skew of the transformed features, the mean valuewas -0.17 (± 0.42)). With these results we <strong>de</strong>ci<strong>de</strong>d to apply the log transformation to thedata.In sequential classification, the sequence was sampled from the testing set. We allowedrepetition in the sampling process.The collected data is <strong>de</strong>picted in figure 6.4. For each user we present 125 samples. Avertical line separates events belonging to different users. For visualization purposes theusers are or<strong>de</strong>red by the mean value of the feature. We simplify this view in the error barplot of figure 6.5.Figure 6.6 presents the probability <strong>de</strong>nsity functions of the SCR events log amplitu<strong>de</strong>of the EDA signal. We observe the overlap of several users that gives rise to the high error

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