Measurements
Electron Spin Resonance and Transient Photocurrent ... - JuSER
Electron Spin Resonance and Transient Photocurrent ... - JuSER
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BIBLIOGRAPHY<br />
[33] F. Finger, J. Müller, C. Malten, and H. Wagner. Electronic states in hydrogenated<br />
microcrystalline silicon. Philos. Mag. B, 77:805, 1998.<br />
[34] P. Kanschat, K. Lips, R. Brüggemann, A. Hierzenberger, I. Sieber, and<br />
W. Fuhs. Paramagnetic defects in undoped microcrystalline silicon deposited<br />
by the hot-wire technique. Mater. Res. Soc., 507:793, 1998.<br />
[35] J. Müller, F. Finger, R. Carius, and H. Wagner. Electron spin resonance<br />
investigation of electronic states in hydrogenated microcrystalline silicon.<br />
Phys. Rev. B, 60:11666, 1999.<br />
[36] P. Kanschat, H. Mell, K. Lips, and W. Fuhs. Defect and tail states in microcrystalline<br />
silicon investigated by pulsed esr. Mater. Res. Soc. Proc.,<br />
609:A27.3, 2000.<br />
[37] M. Kondo, T. Ohe, K. Saito, T. Nishimiya, and A. Matsuda. Morphological<br />
study of kinetic roughening on amorphous and microcrystalline silicon<br />
surface. J. Non-Cryst. Solids, 227-230(B):890–895, 1998.<br />
[38] P. Kanschat, K. Lips, and W. Fuhs. Identification of non-radiative recombination<br />
paths in microcrystalline silicon (µc-si:h). J. Non-Cryst. Solids,<br />
266-269:524–528, 2000.<br />
[39] F. Finger, J. Müller, C. Malten, R. Carius, and H. Wagner. Electronic<br />
properties of microcrystalline silicon investigated by electron spin resonance<br />
and transport measurements. Journal of Non-Crystalline Solids, 226-<br />
269:511, 2000.<br />
[40] P. Kanschat. ESR und spinabhängige Rekombination in mikrokristallinem<br />
Silizium. PhD thesis, Philipps-Universität Marburg, 2000.<br />
[41] J.W. Seto. The electrical properties of polycrystalline silicon films. Journal<br />
of Applied Physics, 46:5247, 1975.<br />
[42] T. Weis, R. Lipperheide, U. Wille, and S. Brehme. Barrier-controlled carrier<br />
transport in microcrystalline semiconducting materials: Description<br />
within a unified model. J. Appl. Phys., 92(3):1411, 2002.<br />
[43] S. Brehme, P. Kanschat, T. Weis, K. Lips, and W. Fuhs. Barrier-controlled<br />
transport in highly doped microcrystalline silicon: role of interface states.<br />
Diffus. Defect Data B, Solid State Phenom., 80-81:225, 2001.<br />
[44] R. Carius, F. Finger, U. Backhausen, M. Luysberg, P. Hapke, L. Houben,<br />
M. Otte, and H. Overhof. Electronic properties of microcrystalline silicon.<br />
Mater. Res. Soc. Proc., 467:283, 1997.<br />
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