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VUV Spectroscopy of Atoms, Molecules and Surfaces

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5.4 Core-level spectroscopic tests at ASTRID 93<br />

5.4 Core-level spectroscopic tests at ASTRID<br />

5.4.1 Experimental setup<br />

The core-level spectroscopic tests <strong>of</strong> the CO/Pt <strong>and</strong> O/Al systems were performed<br />

at the SGM I synchrotron-radiation beamline at ASTRID. SGM refers<br />

to the Spherical Grating Monochromator <strong>of</strong> the beamline which can be operated<br />

in the 25–300 eV photon-energy range, using three sets <strong>of</strong> spherical gratings<br />

<strong>and</strong> plane mirrors [89]. For the present experiments the monochromator<br />

was operated with entrance/exit-slit settings <strong>of</strong> 50/50 µm <strong>and</strong> 100/100 µm,<br />

corresponding to 30 meV <strong>and</strong> 50 meV resolutions (FWHM), respectively,<br />

for a ∼100 eV photon energy. A target chamber is installed at the end <strong>of</strong><br />

the beamline <strong>and</strong> the sample can be moved to a pre-chamber with st<strong>and</strong>ard<br />

equipment for surface preparation <strong>and</strong> -characterization. This includes an<br />

ion sputter gun, a quadropole mass spectrometer (QMS) <strong>and</strong> LEED apparatus.<br />

The horizontally polarized synchrotron-radiation beam is incident on the<br />

surface at 40 ◦ with respect to the surface normal <strong>and</strong> photoelectrons emitted<br />

within a ∼0.1 steradian space angle normal to the surface are colleced with<br />

a SCIENTA electron spectrometer [90], as shown in figure 5.5. The electrons<br />

are focused onto the entrance slit <strong>of</strong> the spectrometer by a lens system <strong>and</strong><br />

are dispersed according to their kinetic energy by the radial electrostatic field<br />

between the hemispheres. The lens system in addition retards the electrons<br />

to a pre-determined pass energy, Epass, which is proportional to the voltage<br />

difference between the two concentric spheres. Due to the spherical symmetry<br />

<strong>of</strong> the spectrometer, the entrance slit is imaged onto the detector system,<br />

consisting <strong>of</strong> a Microchannel-Plate Detector (MCP) <strong>and</strong> a Charged-Coupled<br />

Device (CCD) camera. There is thus no need for an exit slit <strong>and</strong> energies<br />

within a window <strong>of</strong> size Epass/10 can be simultaneously detected. The energy<br />

resolution ∆Espec (FWHM) <strong>of</strong> the spectrometer is given by the width ∆r <strong>of</strong><br />

the entrance slit <strong>and</strong> the pass energy as ∆Espec =∆r/(Epass2r) wherer =<br />

20 cm is the mean radius <strong>of</strong> the hemispheres. The ultimate energy resolution<br />

that can be achieved is ∼5 meV but for the present purpose the spectrometer<br />

was operated with a resolution in the 40–150 meV range.<br />

The base pressure <strong>of</strong> the target chamber is ∼1×10 −10 Torr <strong>and</strong> has to<br />

be at least that good if the surface is to be kept clean during a few hours<br />

<strong>of</strong> measurement. Gas doses are usually given in Langmuir, with 1 L =<br />

1×10 −6 Torr·s, which is approximately the amount required for a monolayer<br />

coverage <strong>of</strong> rest gas (N2), assuming a sticking probability <strong>of</strong> unity. This<br />

means that if every (rest) gas molecule hitting the surface stays there, a<br />

monolayer coverage is obtained in one second at a pressure <strong>of</strong> 1×10 −6 Torr!<br />

A surface therefore has to be cleaned every day before use, which was done<br />

by Ar + sputtering followed by annealing to elevated temperatures. By the

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