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VUV Spectroscopy of Atoms, Molecules and Surfaces

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5.3 The technique <strong>of</strong> core-level spectroscopy 89<br />

5.3 The technique <strong>of</strong> core-level spectroscopy<br />

The most common techniques in use today for structural analysis <strong>of</strong> surfaces<br />

at the atomic level are Low-Energy Electron Diffraction (LEED) [65],<br />

Surface-Extended X-ray Absorption Fine Structure (SEXAFS) [66], X-ray<br />

Photo-Electron Diffraction (PED) [67], X-ray Core-Level <strong>Spectroscopy</strong> (CLS)<br />

[68, 69, 70, 71] <strong>and</strong> Scanning-Tunneling Microscopy (STM) [72]. Apart from<br />

STM, the surface sensitivity <strong>of</strong> these techniques is accomplished by the short<br />

(

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