Nano-Or Presentation
Nano-Or Presentation
Nano-Or Presentation
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The 3DScope2000 System<br />
• High-accuracy Z axis<br />
measurement – equivalent to<br />
phase shift interferometers<br />
+<br />
• No sensitivity to vibration<br />
• No scanning<br />
• No sensitivity to focus variations<br />
• Same foot print as microscope<br />
• Fast set-up – fast measurement<br />
• Short operation learning curve<br />
• High-End White light microscope<br />
• Multiple objectives<br />
• Bright and dark field<br />
• Optical quality eye piece<br />
• Colored CCD<br />
• Filters, polarizers<br />
• Optional motorized capabilities<br />
Stage<br />
Auto-focus<br />
Turret<br />
• Automated sample handling<br />
• Unified system<br />
• Automation<br />
• Production floor compliance<br />
• Integration with peripheral test<br />
and measurement equipment<br />
April 2004 Confidential / Proprietary<br />
3
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