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shot noise in mesoscopic conductors - Low Temperature Laboratory

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Ya.M. Blanter, M. Bu( ttiker / Physics Reports 336 (2000) 1}166 121<br />

Fig. 33. Shot <strong>noise</strong> observed at the same sample for three di!erent temperatures by Ste<strong>in</strong>bach et al. [80]. Dashed and<br />

solid l<strong>in</strong>es <strong>in</strong>dicate the -suppression and the hot electron result F"3/4. The temperature is the lowest for the lowest<br />

curve. Copyright 1996 by the American Physical Society.<br />

At this po<strong>in</strong>t, we summarize the <strong>in</strong>formation we obta<strong>in</strong>ed from the scatter<strong>in</strong>g and Boltzmann}<br />

Langev<strong>in</strong> approaches about the e!ects of the electron}electron <strong>in</strong>teractions on <strong>noise</strong>. There are two<br />

characteristic times, one responsible for dephas<strong>in</strong>g processes, , and another one due to <strong>in</strong>elastic<br />

(<br />

scatter<strong>in</strong>g (electron heat<strong>in</strong>g), . We expect ; . Dephas<strong>in</strong>g does not have an e!ect on <strong>noise</strong>,<br />

( <br />

and thus for short enough samples, D/¸<<br />

, the Fano factor is (irrespectively of the relation<br />

<br />

between D/¸ and ). For long wires, D/¸;,<br />

the Fano factor equals 3/4 due to electron<br />

( <br />

heat<strong>in</strong>g. For even longer wires the electron}phonon <strong>in</strong>teractions become important (see below),<br />

and <strong>shot</strong> <strong>noise</strong> is suppressed down to zero.<br />

The microscopic theory, however, predicts three characteristic times responsible for electron}electron<br />

scatter<strong>in</strong>g <strong>in</strong> disordered systems (for a nice qualitative explanation, see Ref. [251]).<br />

One is the dephas<strong>in</strong>g time , another one is the energy relaxation time, , and the third one, for<br />

( <br />

which we keep the notation , has the mean<strong>in</strong>g of the average time between electron}electron<br />

<br />

collisions. While the dephas<strong>in</strong>g time is quantum-mechanical and cannot be accounted for <strong>in</strong> the<br />

classical theory, the <strong>in</strong>formation about and is conta<strong>in</strong>ed <strong>in</strong> the collision <strong>in</strong>tegral (227). For<br />

<br />

three-dimensional disordered systems, all the three times co<strong>in</strong>cide: The presence of dephas<strong>in</strong>g<br />

always means the presence of <strong>in</strong>elastic scatter<strong>in</strong>g and electron heat<strong>in</strong>g. The situation is, however,<br />

di!erent <strong>in</strong> two- and one-dimensional systems, where the three times di!er parametrically, with the<br />

relation [251,247] ; ; . This is <strong>in</strong> apparent contrast with the <strong>in</strong>tuitive predictions of the<br />

( <br />

scatter<strong>in</strong>g approach, and opens a number of questions. First, it is not clear whether or is<br />

<br />

responsible for the }3/4 crossover <strong>in</strong> the classical theory. Then, the role of dephas<strong>in</strong>g, which is<br />

<br />

not taken <strong>in</strong>to account <strong>in</strong> the Boltzmann}Langev<strong>in</strong> approach, may need to be revisited. These<br />

questions may only be answered on the basis of a microscopic theory.<br />

We must po<strong>in</strong>t out here that <strong>in</strong>teractions, besides alter<strong>in</strong>g the amplitude of <strong>shot</strong> <strong>noise</strong>, also create<br />

an additional source of <strong>noise</strong> <strong>in</strong> di!usive <strong>conductors</strong>, s<strong>in</strong>ce the mov<strong>in</strong>g electrons produce #uctuat<strong>in</strong>g<br />

electromagnetic "eld, as discovered by von Oppen and Stern [252]. Referr<strong>in</strong>g the reader to<br />

Ref. [252] for details, we mention that this <strong>noise</strong> is proportional to < for low voltages, and to<br />

for D/¸;;k ¹. As a function of frequency, this <strong>noise</strong> saturates for low frequen-<br />

<br />

cies, and vanishes for

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