shot noise in mesoscopic conductors - Low Temperature Laboratory
shot noise in mesoscopic conductors - Low Temperature Laboratory
shot noise in mesoscopic conductors - Low Temperature Laboratory
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54 Ya.M. Blanter, M. Bu( ttiker / Physics Reports 336 (2000) 1}166<br />
measured and correlated with the <strong>in</strong>tensity #uctuation dI (t#), where is a short time smaller<br />
<br />
than the response time of the detector. The co<strong>in</strong>cidence rate C is thus<br />
<br />
<br />
C "(1/2)<br />
<br />
ddIK (t)dIK (t#)#dIK (t#)dIK (t) . (104)<br />
<br />
<br />
The co<strong>in</strong>cidence rate is related to the frequency-dependent <strong>noise</strong> power spectrum by<br />
<br />
C "(1/)<br />
<br />
d d eS () . (105)<br />
<br />
<br />
In Section 3, we discuss the frequency dependence of the <strong>noise</strong> power spectrum <strong>in</strong> more detail.<br />
Typically, its lowest characteristic frequencies are given by RC-times. In pr<strong>in</strong>ciple, such a measurement<br />
should, therefore, be able to give <strong>in</strong>formation on the frequency dependence of the <strong>noise</strong> power<br />
spectrum. In the experiment of Oliver et al. the resolution time is probably long compared to such<br />
<strong>in</strong>tr<strong>in</strong>sic time scales, and thus the experiment is e!ectively determ<strong>in</strong>ed by the white-<strong>noise</strong> limit of<br />
the power spectrum.<br />
Let us now brie#y consider a Y-shaped conductor [21] and discuss its correlations <strong>in</strong> the<br />
white-<strong>noise</strong> limit. We assume that the same voltage < is applied between the term<strong>in</strong>als 1 and 2,<br />
and 1 and 3: " #e