Demystifying Auto-Zero Amplifiers—Part 1 - Analog Devices

More documents

Recommendations

Info

CLOCK CONFIG REG. BIT 4 FAN 0 INPUT FAN 1 INPUT FAN 0 MEASUREMENT PERIOD START OF MONITORING CYCLE FAN 1 MEASUREMENT PERIOD Figure 8. Fan-speed measurement. What other issues are there with fan-speed control? When controlling a fan using PWM, the minimum duty cycle for reliable continuous fan operation is about 33%. However, a fan will not start up at 33% duty cycle because there is not enough power available to overcome its inertia. As noted in the discussion of Figure 6, the solution to this problem is to spin the fan up for two seconds on start-up. If the fan needs to be run at its minimum speed, the PWM duty cycle may then be reduced to 33% after the fan has spun up, and it is protected from stalling by the hysteresis. FAN STALLS AND FAN FAILURES Nevertheless, the possibility can arise that a fan may stall at some time while used in a system. Causes may include a fan operating too slowly, or dust build-up preventing it from spinning. For this reason, the Analog Devices systems monitors have an on-chip mechanism based on the fan’s tach output to detect and restart a stalled fan. If no tach pulses are being received, the value in the Tach Value register will exceed the limit in the Tach Limit Register and an error flag will be set. This will cause the controller to attempt to restart the fan by trying to spin it up for two seconds. If the fan continues to fail, for up to five attempted restarts, a catastrophic fan failure is acknowledged to exist, and a FAN_FAULT pin will assert to warn the system that a fan has failed. In two-fan dual-controller systems, the second fan can be spun up to full speed to try to compensate for the loss in airflow due to the failure of the first fan. SUMMARY Superior thermal-management solutions continue to be developed and offered to the computing industry by Analog Devices. The techniques developed for the ADM1029, ADM1030/ADM1031, and ADM1026 take thermal management within PCs to a new level. These devices are packed with features such as temperature monitoring, automatic temperature control in hardware, fan-speed measurement, support for backup and redundant fans, fan-present and fan-fault detection, programmable PWM frequency, and duty cycle. As power guidelines become more stringent, and PCs run significantly hotter, more sophisticated temperature-measurement and fan-speed-control techniques are being developed to manage the systems of the future more effectively. REFERENCES 1. Mobile Power Guidelines ’99 Revision 1.00, Intel Corporation. http://developer.intel.com/design/mobile/Intelpower/ mpg99r1.pdf 2. Advanced Configuration and Power Interface Specification, Revision 1.0b, Intel Corporation, Microsoft Corporation, Toshiba Corp. http://www.teleport.com/~acpi/DOWNLOADS/ ACPIspec10b.pdf 3. Intelligent Platform Management Interface: “What is IPMI?” Intel Corporation. http://developer.intel.com/design/servers/ ipmi/ipmi.htm b ADM1030 Functional Block Diagram V CC NC NC ADM1030 SLAVE ADDRESS REGISTER FAN CHARACTERISTICS REGISTER SERIAL BUS INTERFACE ADDRESS POINTER REGISTER ADD SDA SCL NC PWM_OUT PWM CONTROLLER FAN SPEED CONFIG REGISTER INTERRUPT MASK REGISTER INT/NTO TMIN/TRANGE REGISTER INTERRUPT STATUS REGISTER THERM FAN_FAULT TACH/AIN TACH SIGNAL CONDITIONING FAN SPEED COUNTER LIMIT COMPARATOR NC D D–/NTI BANDGAP TEMPERATURE SENSOR ANALOG MULTIPLEXER ADC 2.5V BANDGAP REFERENCE VALUE AND LIMIT REGISTERS OFFSET REGISTER CONFIGURATION REGISTER GND NC= NO CONNECT 20 Analog Dialogue 34-4 (2000)
Finding the Needle in a Haystack: Measuring small differential voltages in the presence of large common-mode voltages by Scott Wayne INTRODUCTION In applications such as motor control, power-supply current monitoring, and battery cell-voltage monitoring, a small differential voltage must be sensed in the presence of a high common-mode voltage. Some of these applications require galvanic isolation, others do not. Some applications use analog control, others use digital control. Four cases of such measurements will be considered, each requiring unique considerations. They are: 1) galvanic isolation with analog output; 2) galvanic isolation with digital output; 3) no galvanic isolation, analog output; 4) no galvanic isolation, digital output. Differential Signals Versus Common-Mode Signals Figure 1 shows the input of a measurement system. V DIFF represents the differential voltage, the signal of interest. V CM represents the common-mode voltage, which contains no useful information about the measurement and could in fact reduce the measurement accuracy. The common-mode voltage could be an implicit part of the measurement system, as in a battery cell-voltage monitoring application, or it could be created by a fault condition where the sensor accidentally comes in contact with a high voltage. In either case, that voltage is unwanted, and it is the job of the measurement system to reject it, while responding to the differential-mode voltage. V DIFF V CM R1 R1 R2 R2 R2 V OUT = ——V R1 DIFF Figure 1. Measurement system with differential and commonmode voltages. Common-Mode Rejection (CMR) The measurement system has both a differential-mode gain and a common-mode gain. The differential-mode gain is usually greater than or equal to one, while the common-mode gain is ideally zero. Resistor mismatches cause the dc gain from the inverting input to differ slightly from that of the noninverting input. This, in turn, results in a dc common-mode gain that is nonzero. If the differential R2 gain is G = , the common-mode gain will be R 1 %mismatch G × . The common-mode rejection ratio (CMRR) is 100 G + 1 the differential-mode gain divided by the common-mode gain, or 100 × ( G + 1). The logarithmic equivalent (CMR—in dB), %mismatch ( ) ⎡ 100 ⎤ is 20log 10 ⎢ × G + 1 ⎣%mismatch ⎥ . ⎦ In real-world applications, external interference sources abound. Pickup will be coupled from the ac power line (50/60 Hz and its harmonics), from equipment switching on and off, and from radiofrequency transmission sources. This type of interference is induced equally into both differential inputs, and therefore appears as a common-mode signal. So, in addition to high dc CMR, instrumentation amplifiers also require high ac CMR, especially at line frequencies and their harmonics. DC common-mode errors are mostly a function of resistor mismatch. In contrast, ac commonmode errors are a function of differences in phase shifts or time delays between the inverting and noninverting inputs. These can be minimized by using well-matched high-speed components, and they can be trimmed with a capacitor. Alternatively, in lowfrequency applications, output filtering can be used if necessary. While dc common-mode errors can usually be removed through calibration or trimming. AC common-mode errors, which can reduce the resolution of the measurement, are generally of greater concern. All Analog Devices instrumentation amplifiers are fully specified for both dc and low-frequency ac common-mode rejection. Galvanic Isolation Some applications require that there be no direct electrical connection between the sensor and the system electronics. These applications require galvanic isolation in order to protect the sensor, the system, or both. The system electronics may need to be protected from high voltages at the sensor. Or, in applications requiring intrinsic safety, the sensor excitation and power circuitry may need to be isolated to prevent sparks or the ignition of explosive gases that could be caused by a fault condition. In medical applications, such as electrocardiograms (ECG), protection is required in both directions. The patient must be protected from accidental electric shock. If the patient’s heart stops beating, the ECG machine must be protected from the very high voltages applied to the patient by emergency use of a defibrillator in an attempt to restore the heartbeat. Galvanic isolation is also used to break ground loops where even a small resistance between two system grounds may produce an unacceptably high potential. This could occur in precision conversion systems where milliamperes of current flowing through a few hundredths of an ohm could create hundreds of microvolts of ground error, which could limit the resolution of the measurement. Or it might occur in industrial installations where thousands of amperes of current could create hundreds of volts of ground error and a potentially hazardous situation. Galvanic isolation may use magnetic fields (transformers), electric fields (capacitors), or light (opto-isolators). Each method has its own advantages and disadvantages. For all types, though, isolated power supplies (or batteries) are usually necessary for powering the floating side of the isolator. This can easily be combined with signal isolation in isolators that use transformer isolation barriers. Other methods may require separate transformer-coupled dc-todc converters, which increase cost. Analog Dialogue 34-1 (2000) 21
Page 1 and 2: A forum for the exchange of circuit
Page 3 and 4: IN THIS ISSUE Analog Dialogue Volum
Page 5 and 6: Fundamentals of DSP-Based Control f
Page 7 and 8: current for short bursts of time. T
Page 9 and 10: Embedded Modems Enable Appliances t
Page 11 and 12: DAA Approaches The DAA (data access
Page 13 and 14: The electronic delay in the feedfor
Page 15 and 16: VFBN1 VINN1 VINP1 VFBP1 V REF + + +
Page 17 and 18: During experimentation, the AD73522
Page 19 and 20: versatile machine will use both tec
Page 21: e managed effectively through loop
Page 25 and 26: +5V AV DD DV DD AD7715 I SHUNT R SH
Page 27 and 28: Demystifying Auto-Zero Amplifiers
Page 29 and 30: As mentioned above, virtually all m
Page 31 and 32: Pressure sensor systems, which usua
Page 33 and 34: Designing Comparator Circuits with
Page 35 and 36: Transducer/Sensor Excitation and Me
Page 37 and 38: from the RTD are generally buffered
Page 39 and 40: switched-polarity current source is
Page 41 and 42: on pictures with significant high f
Page 43 and 44: Applications such as security and h
Page 45 and 46: Auxiliary modes. The AD984x series
Page 47 and 48: NOW—True RMS-to-DC Measurements,
Page 49 and 50: ange. These devices comprise a “c
Page 51 and 52: A close-in view (Figure 10) of the
Page 53 and 54: contains four bands (two downstream
Page 55 and 56: Christine Bako (page 38) is an Appl
Page 57 and 58: Analog Dialogue Survey Please cut o

Demystifying Auto-Zero Amplifiers—Part 1 - Analog Devices

You also want an ePaper? Increase the reach of your titles

Delete template?

Save as template?