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EDAX EDS Manual

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Quantitative Analysis with SEC factors --Hans Dijkstra<br />

For microanalysis the composition of a sample can be calculated from the measured X-ray<br />

intensities using:<br />

Meas<br />

W Z A F I<br />

% = • • •<br />

I<br />

Where Z, A and F are the matrix correction parameters, describing the atomic number effect<br />

(stopping power and backscatter effect), the absorption effect, and the fluorescence effect.<br />

Since for standardless analysis we have no Ι STD available, <strong>EDAX</strong> has chosen to use calculated<br />

standards, with in a simplified form:<br />

N<br />

I n p f<br />

A R<br />

Q E<br />

dE d s dE<br />

0 E j<br />

Std Ω<br />

j ( )<br />

Calculated = εεεε dωωωω j jl ( χχχχ)<br />

����<br />

4ππππ<br />

E / ( ρρρρ )<br />

0<br />

Where n is the number of electrons entering the sample, Ω/4π is the solid angle, ε is the detector<br />

efficiency, ω is the X-ray fluorescence yield, p is the relative probability for the transition involved,<br />

f(x) is the absorption correction, and the integral represents the cross-section of the ionization<br />

involved. Since n is unknown, and thus set to 1, the calculated intensity might be in a totally<br />

different order of magnitude as the measured intensity. Normalizing the W% to 100% solves this<br />

problem.<br />

This function seems to work rather accurate, but it is important to notice that some factors are left<br />

out of the calculations, like the solid angle, since this is a constant factor and this equation is only<br />

used for standardless analysis, i.e. the results are normalized to 100% anyway.<br />

One disadvantage of this equation is that εd, the detector efficiency, can not be predicted with<br />

sufficient accuracy for X-ray lines below 1 keV. Small variations in detector quality (Si dead layer,<br />

etc.) can cause variations in measured intensity. Therefore <strong>EDAX</strong> has introduced the SEC factors.<br />

The final equation now becomes:<br />

I<br />

W% = Z • A•F •<br />

SEC •<br />

I<br />

The SEC factors can simply be calculated by entering a compound standard, and calculate the SEC<br />

from the given W% (thus the ZAF factors and the standard intensity can be calculated) and the<br />

measured intensities. Also in this procedure calculated SEC factors may be off by an order of<br />

magnitude, and now this is solved by assuming one SEC factor to be identical to a default value<br />

(thus keeping it fixed), and scaling other SEC factors relative to the fixed one.<br />

________________________________________________________________________<br />

<strong>EDAX</strong> Training Course –Quantitative Analysis with SEC Factors - page 1<br />

Meas<br />

Std<br />

Std<br />

Calculated

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