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CHAPTER 5: LUMINOSITY FUNCTION OF XMS SOURCES log N h 20 22 24 AGN1 AGN2 42 42.5 43 43.5 44 44.5 log L x (4.5−7.5 keV) Figure 5.1 Intrinsic N H versus X-ray luminosity of XMS sources detected in the Ultrahard band. Dots represent those sources identified as Type-1 AGN while the Triangles are those classified as Type-2 AGN. The dashed line at log N H = 22 marks the standard separation between absorbed and unabsorbed AGN. commonly used to separate absorbed AGN from the unabsorbed ones (see Figure 5.1). An appropiate calculation of the XLF of these sources would therefore require a previous modelling of the intrinsic absorption in order to avoid possible selection effects. On the contrary, sources detected in the soft band (0.5- 2 keV) are so strongly affected by absorption that we can assume that we are mainly sampling unabsorbed AGN in this band. The N H function f (L X , z; N H ) is a probability distribution function for the absorption column density as a function of the X-ray luminosity and redshift. It is measured in units of (log N H ) −1 and is normalized to unity over a defined N H region: ∫ log NH max f (L X , z; N H )d log N H = 1 (5.2.1) log N Hmin We have chosen the N H limits to be log N Hmin = 20 and log N Hmax = 24 given 118
CHAPTER 5: LUMINOSITY FUNCTION OF XMS SOURCES the intrinsic N H range spanned by our joint samples (see Figure 5.2). The observed fraction of obscured AGN (those with log N H > 22) is measured by the parameter ψ, which is generally function of the both luminosity and redshift. If we compare the value of ψ at different luminosity ranges we observe that the fraction of absorbed AGN is not constant, decreasing as the luminosity increases in both the hard and ultrahard bands (see Figures 5.3 and 5.4). On the other hand, there is not significant variation in the value of ψ with redshift at a given luminosity in the ultrahard band (see Figure 5.4), which can be partly explained by the poor redshift coverage of this sample. The fraction, however, clearly increases with redshift in the case of the hard band (see Figures 5.3). We will therefore assume that the formal expression of ψ is dependent on both the X-ray luminosity and redshift and hence we have formalized it as a linear function of both log L X and z, similarly as in [130]: ψ(L X , z) = ψ 44 [(log L X − 44)β L + 1] [(z − 0.5)β z + 1] (5.2.2) where ψ 44 is the fraction of absorbed AGN at log L X = 44 and z = 0.5, and β L and β z are the slopes of the linear dependencies on luminosity and redshift, respectively. Given equation 5.2.1, the normalized N H function can be written as: f (L X , z; N H ) = { 1−ψ(LX ,z) 2 ; 20 ≤ log N H < 22 ψ(L X ,z) 2 ; 22 ≤ log N H ≤ 24 } (5.2.3) In order to obtain the best-fit values of the free parameters ψ 44 , β L and β z we have performed a χ 2 fit on the sources of the hard and ultrahard samples, although in the latter case we have fixed β z = 0 to account for the absence of dependence on redshift observed in this band. The values thus obtained are ψ 44 = 0.41 +0.03 −0.04 , β L = −0.22 +0.04 −0.05 and β z = 0.57 +0.12 −0.10 for the hard band, and ψ 44 = 0.22 ± 0.04 and β L = −0.45 +0.20 −0.25 for the ultrahard band (see Table 5.2). The 1σ errors correspond to ∆χ 2 = 1. The expected fraction of absorbed AGN in the hard band at z = 0 is ψ 44 = 0.29 ± 0.05, while the expected fraction in the ultrahard band coverted to the 2-10 keV band is ψ 44 = 0.27 ± 0.08, mutually consistent with each other. If we compare these results with those of [224] and [130], we find that our bestfit value at log L 2−10 = 44 (ψ 44 = 0.41 +0.03 −0.04 ) is in excellent agreement with the 119
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Universidad de Cantabria Departamen
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A mis padres
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explicar las altas luminosidades de
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Además, una importante fracción (
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ealizar estudios de espectroscopía
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distribución diferencial que, al e
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materia sobre el agujero negro cent
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analizadas proviene de fuentes en t
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Haciendo uso del segundo catálogo
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With magic, you can turn a frog int
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Un capítulo aparte merecen mis com
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Summary Since its discovery more th
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xxxiv
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CONTENTS 1.6.1 The K-correction . .
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CONTENTS 5.3.2 Analytical model . .
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LIST OF FIGURES 4.6 Soft 1 − P µ
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Chapter 1 Introduction In the last
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CHAPTER 1: INTRODUCTION have confir
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CHAPTER 1: INTRODUCTION by this mis
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CHAPTER 1: INTRODUCTION Figure 1.2
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CHAPTER 1: INTRODUCTION [161], [242
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CHAPTER 1: INTRODUCTION tant contri
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CHAPTER 1: INTRODUCTION to-noise ra
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CHAPTER 1: INTRODUCTION Compton up-
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CHAPTER 1: INTRODUCTION ([142]). It
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CHAPTER 1: INTRODUCTION (NLR) and i
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CHAPTER 1: INTRODUCTION optically c
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CHAPTER 1: INTRODUCTION ber of AGN
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CHAPTER 1: INTRODUCTION Figure 1.5
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CHAPTER 1: INTRODUCTION 1.7.3 The X
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CHAPTER 1: INTRODUCTION AGN are ess
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CHAPTER 1: INTRODUCTION subjects ma
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CHAPTER 2: AGN SURVEYS WITH XMM-New
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R R OQP ONM 40 Table 2.1: Continued
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Chapter 3 Source counts of the AXIS
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CHAPTER 3: SOURCE COUNTS OF THE AXI
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61 Table 3.1 Maximum likelihood fit
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Page 206 and 207: REFERENCES [16] Barger, A. J., Cowi
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REFERENCES [148] Matarrese, S., Col
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REFERENCES [190] Richstone, D., Ahj
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REFERENCES [236] Wisotzky, L., 1998
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