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User Guide: NanoLC Ultra® System Integration Test - Eksigent

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LC/MS <strong>System</strong> Configuration <strong>Test</strong>— AB SCIEX TripleTOF 5600 <strong>System</strong><br />

8. Make sure the peaks have good separation and shape using the PeakView software.<br />

i. In the PeakView software, on the Window menu, click Graph Selection<br />

Window.<br />

ii. Note the retention times of the chosen peaks.<br />

This will vary with each system. Time of elution of the first is about 14 to 16<br />

minutes. The longer elution time indicates you need to minimize LC dead<br />

volume.<br />

Note: Most of the XICs obtained should have peak widths of ~0.17 minute<br />

half height on average and have peak intensities similar to that shown in<br />

Figure 1-29. Some peaks will be narrower and some will be broader.<br />

Measure the Performance of the TOF MS/MS Scan<br />

1. In the main TIC pane, extract individual TICs by double-clicking the magenta arrow.<br />

2. Select the MS/MS scan, and then select Remove all Traces Except Active to<br />

display the pane shown in Figure 1-30.<br />

Figure 1-30 TOF MS/MS XIC of m/z 729.3652 peak<br />

<strong>NanoLC</strong> Ultra ® <strong>System</strong><br />

44 of 124<br />

<strong>System</strong> <strong>Integration</strong> <strong>Test</strong><br />

D5030175 A

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