z/OS V1R6.0 DFSMS Access Method Services for Catalogs

Chapter 21. DIAGNOSEThe DIAGNOSE command scans a basic catalog structure (BCS) or a VSAMvolume data set (VVDS) to validate the data structures and detect structure errors.See Chapter 22, “EXAMINE,” on page 245 for information on the EXAMINEcommand, which can inspect the structural integrity of the data or indexcomponent of a key-sequenced data set cluster or of a BCS.The syntax of the DIAGNOSE command is:DIAGNOSE{ICFCATALOG|VVDS}{INFILE(ddname)| INDATASET(datasetname)}[COMPAREDD(ddname [ ddname...])|COMPAREDS(dsname [ dsname...])][DUMP|NODUMP][ERRORLIMIT(value)][EXCLUDE({ENTRIES(entryname[ entryname...])|CATALOG(catalogname[ catalogname...])| LEVEL(level)})|INCLUDE({ENTRIES(entryname[ entryname...])|CATALOG(catalogname[ catalogname...])| LEVEL(level)})][LIST|NOLIST][OUTFILE(ddname)]DIAGNOSE ParametersDIAGNOSE can be abbreviated: DIAGBecause the DIAGNOSE command checks the content of the catalog records, andthe records might, for example, contain damaged length field values, there is apossibility that the job will abend. For detailed information on using DIAGNOSE,see z/OS DFSMS: Managing Catalogs.The DIAGNOSE command uses the following parameters.Required ParametersICFCATALOG|VVDSSpecifies which data set is to be scanned for diagnosis.You must have access authority under the RACF FACILITY class to diagnose aBCS or a VVDS.ICFCATALOGspecifies that the data set to be scanned for diagnosis is the basic catalogstructure (BCS).Abbreviation: ICFCAT© Copyright IBM Corp. 1973, 2004 237