Biennial Report 2005-2007 - Saha Institute of Nuclear Physics

184 Biennial Report 2005-07Fig.5.2.1.3a. Transmission Electron Microscopy (TEM) of thin Carbon Film showingelectron diffraction patternThe pattern has been indexed by Carbon with hexagonal crystal structure. The lattice parametersare a= 0.2522nm and c= 1.64743nm. The zone axis of the diffraction pattern is found to be [110].The micrograph of the region, as shown in Fig.5.2.1.3b, from where the diffraction pattern has beentaken shows the single crystalline film.Fig.5.2.1.3b. Transmission Electron Microscopy (TEM) of thin Carbon Film showingthe Kekuchi line in the miocrograph of the region of the film wherein the electrondiffraction pattern is obtained in (Fig.5.2.1.3b)