Test Cost

Special package tests (maxwell, 2007)• Package test had to be repeated even though the diehad been prescreened on wafer test (maxwell, 2002)• Peripheral vector vs normal vector– Faults in the pad and pad logic– Faults in “logical proximity” to pad– Faults in physical proximity it to pad• The periphery set are not a satisfactory replacementFail regular scan physical logicalStuck-at 641msTransition 710msStuck-at physical 20msTransition physical 58msStuck-at logical 12msTransition logical 25msStuck-at pad 10msTransition pad 18msTable. Execution times of tests2336 2 0 10Fail peripherypad110 0Figure. Distribution of failed parts0