Test Cost
Test Cost
Test Cost
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Scan stitching• Scan Compression– Architectured2a1T16 16test_si192 192data_in data_out data_in data_outtest_soSCCOMP_DECOMPRESSORselscan chainSCCOMP_COMPRESSORSTPI_VALIDSTPI_SOPSTPI_DATASTPI_CLKGPIO[0]TMOD_Ntest modedecoding logic– Advantagetest_setwhen TMOD_N = 0, {GPIO[0], STPI_CLK, STPI_DATA} = 3’b111test_se = STPI_VALIDad_scan_mode = STPI_SOP ( 1 : ScanCompression_mode,**0 : Internal_scan)• Decrease test time and test data volume• Increase test quality when addressed ATE memory limitation problem– Disadvantage• Area overhead : 10 gates per 1 sub scan chain– Compression ratio : 10X
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