Test Cost
Test Cost
Test Cost
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Analog test time reduction• ADC & DAC TTR– AC, DC test item의 선정– Sample 수의 감소– Bit수의 감소– Stabilization time의 단축• PLL TTR– 중복되는 test item의 제거– Data 산포에 영향을 주지 않는 Sampling 수의 선정– Loop-back test를 통한여러pll의 동시test1.41.21<strong>Test</strong>Time v s Sample CountTime<strong>Test</strong> T0.80.60.40.2010002000300040005000600070008000900010000110001200013000Sample count14000150001600017000180001900020000SPLL(175Mhz) FS(27Mhz) AuPLL(24Mhz) DPLL(27.1Mhz)Figure. <strong>Test</strong> time vs sample count in PLL test
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