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Virtual Qualification of Electronic Hardware - NEPP - NASA

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Use<br />

Category<br />

Section 1<br />

Section 2<br />

Life Cycle Loading Characterization<br />

The temperatures shown in Table 1 were taken as inputs to the thermal analysis.<br />

Section 1 and section 2 are combined to account for one cycle.<br />

Tmin<br />

( 0 C)<br />

9.5<br />

12.5<br />

Tmax<br />

( 0 C)<br />

49<br />

82<br />

AS900 nominal<br />

temperature pr<strong>of</strong>ile for<br />

one cycle<br />

Temperature ( o Temperature ( C)<br />

o Temperature ( C)<br />

o C)<br />

Ramp time to<br />

Tmax/ to Tmin<br />

35 min/ 35 min<br />

50 min/ 15 min<br />

120<br />

100<br />

80<br />

60<br />

40<br />

20<br />

0<br />

-20<br />

-40<br />

-60<br />

Section 1<br />

Dwell at Tmax<br />

/Tmin<br />

25 min /30 min<br />

35 min /30 min<br />

Table 1. Sections <strong>of</strong> one thermal cycle<br />

Time <strong>of</strong><br />

Cycles<br />

175 min<br />

160 min<br />

CALCE <strong>Electronic</strong> Products and Systems Center University <strong>of</strong> Maryland<br />

c:\mydocuments\presentations\jpl010516.ppt<br />

Total time<br />

365 days/ 10<br />

year<br />

365 days/ 10<br />

year<br />

0 50 100 150 200 250<br />

Time (minutes)<br />

Section 2

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