Virtual Qualification of Electronic Hardware - NEPP - NASA
Virtual Qualification of Electronic Hardware - NEPP - NASA
Virtual Qualification of Electronic Hardware - NEPP - NASA
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Use<br />
Category<br />
Section 1<br />
Section 2<br />
Life Cycle Loading Characterization<br />
The temperatures shown in Table 1 were taken as inputs to the thermal analysis.<br />
Section 1 and section 2 are combined to account for one cycle.<br />
Tmin<br />
( 0 C)<br />
9.5<br />
12.5<br />
Tmax<br />
( 0 C)<br />
49<br />
82<br />
AS900 nominal<br />
temperature pr<strong>of</strong>ile for<br />
one cycle<br />
Temperature ( o Temperature ( C)<br />
o Temperature ( C)<br />
o C)<br />
Ramp time to<br />
Tmax/ to Tmin<br />
35 min/ 35 min<br />
50 min/ 15 min<br />
120<br />
100<br />
80<br />
60<br />
40<br />
20<br />
0<br />
-20<br />
-40<br />
-60<br />
Section 1<br />
Dwell at Tmax<br />
/Tmin<br />
25 min /30 min<br />
35 min /30 min<br />
Table 1. Sections <strong>of</strong> one thermal cycle<br />
Time <strong>of</strong><br />
Cycles<br />
175 min<br />
160 min<br />
CALCE <strong>Electronic</strong> Products and Systems Center University <strong>of</strong> Maryland<br />
c:\mydocuments\presentations\jpl010516.ppt<br />
Total time<br />
365 days/ 10<br />
year<br />
365 days/ 10<br />
year<br />
0 50 100 150 200 250<br />
Time (minutes)<br />
Section 2