Virtual Qualification of Electronic Hardware - NEPP - NASA
Virtual Qualification of Electronic Hardware - NEPP - NASA
Virtual Qualification of Electronic Hardware - NEPP - NASA
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Defining the Life Cycle Stress Pr<strong>of</strong>ile<br />
Stress pr<strong>of</strong>ile was created using<br />
results <strong>of</strong> the thermal analysis runs<br />
considering the electronics be<br />
operational full time.<br />
CALCE <strong>Electronic</strong> Products and Systems Center University <strong>of</strong> Maryland<br />
Temperature ( o Temperature ( C)<br />
o Temperature ( C)<br />
o C)<br />
120<br />
100<br />
80<br />
60<br />
40<br />
20<br />
0<br />
-20<br />
-40<br />
-60<br />
Section 1<br />
0 50 100 150 200 250<br />
Time (minutes)<br />
c:\mydocuments\presentations\jpl010516.ppt<br />
Section 2
![mil-std-2223 [test methods for insulated electric wire] - NEPP](https://img.yumpu.com/4036001/1/190x249/mil-std-2223-test-methods-for-insulated-electric-wire-nepp.jpg?quality=85)
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