Virtual Qualification of Electronic Hardware - NEPP - NASA

Temperature
Cycle
•-50 °C to 125 °C
Temp limits
•10 min. Dwell time
•15 °C/min ramp rate
•~45 cycles per day
Review and Verification: Physical Test
Temperature (C)
140
120
100
80
60
40
20
0
-20
-40
-60
0 10 20 30 40 50 60 70 80 90
Time (min)
Board was inspected every 100 cycles until visible failure was
noticed under magnification. Subsequent inspection was every
50 cycles.
CALCE Electronic Products and Systems Center University of Maryland
c:\mydocuments\presentations\jpl010516.ppt