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Virtual Qualification of Electronic Hardware - NEPP - NASA

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Design Capture<br />

<strong>Virtual</strong> <strong>Qualification</strong> Methodology<br />

Load<br />

Load<br />

Transformation<br />

Ranking <strong>of</strong> Potential Failures<br />

Under Life-Cycle Loads<br />

1<br />

Failure Risk<br />

Assessment<br />

2<br />

3<br />

Time to Failure<br />

CALCE <strong>Electronic</strong> Products and Systems Center University <strong>of</strong> Maryland<br />

Field<br />

c:\mydocuments\presentations\jpl010516.ppt<br />

Life-Cycle Loading<br />

Characterization<br />

Physical Verification: Test Setup, Specimen Characterization, Accelerated Stress Test

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