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Virtual Qualification of Electronic Hardware - NEPP - NASA

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Handling Multiple Environments for the Same<br />

Failure Site<br />

Damage is defined as the percent <strong>of</strong> life removed from a functional structure. If<br />

we assume that data is accumulated in a linear fashion, then we can define a<br />

damage index as<br />

where n is the applied time and N is the survivable time. Failure is defined if<br />

n ≥ N or D ≥1<br />

.<br />

For multiple environments and the same failure site and mechanism. We can<br />

define the total damage as the sum <strong>of</strong> the damage indices for the individual<br />

environments or<br />

Dtotal=<br />

∑Di<br />

i<br />

Failure is assumed to occur when<br />

D=<br />

n<br />

N<br />

Dtotal<br />

Caveat: The assumption <strong>of</strong> linear may not be valid for different failure mechanisms. One<br />

needs to understand the physical failure phenomenon to accurately determine the effect <strong>of</strong><br />

multiple environmental factors.<br />

CALCE <strong>Electronic</strong> Products and Systems Center University <strong>of</strong> Maryland<br />

≥1<br />

c:\mydocuments\presentations\jpl010516.ppt

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