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EXAMPLE 17: Full.Coupled Diffusion 312 SUPREM-IV.GS – 2D ...

EXAMPLE 17: Full.Coupled Diffusion 312 SUPREM-IV.GS – 2D ...

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<strong>EXAMPLE</strong> 5: LDD Cross Section<br />

This anneal will be carried out for 20 minutes at 950˚C. The structure is<br />

saved in the file ldd.str. At this point, any of the structure files can be read<br />

back and examined to check the results. Commands and analysis similar to<br />

that found in Example 4 may be performed.<br />

To just perform a simple check, the following commands should produce a<br />

plot.<br />

plot.2d bound fill y.max=1.0<br />

select z=log10(phos+ars)-log10(bor)<br />

contour val=0.0<br />

The first command plots the device outline. The second command selects<br />

the difference in the logs of the doping. This tends to produce much<br />

smoother contours for plotting purposes. The final command plots the<br />

junction location, as shown below.<br />

FIGURE 1 Final LDD Device Structure.<br />

<strong>SUPREM</strong>-<strong>IV</strong>.<strong>GS</strong> <strong>–</strong> <strong>2D</strong> Process Simulation for Si and GaAs 263

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