Lecture Notes in Computer Science 3472

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10 Methodological Issues in Model-Based Testing 291 The fundamental concern of model-based testing seems to be whether or not it is more cost-effective than other approaches—traditional testing, reviews, inspections, and also constructive approaches to quality assurance. While first evaluations of model-based testing are available [PPW + 05], there clearly is a need for studies that examine the economics of model-based testing.
11 Evaluating Coverage Based Testing Christophe Gaston 1 and Dirk Seifert 2 1 Commissariat a l’energie atomique Logiciels pour la Sûreté desProcédés christophe.gaston@cea.fr 2 Technische Universität Berlin Software Engineering Research Group seifert@cs.tu-berlin.de Abstract. In the previous chapters, various formal testing theories have been discussed. The correctness of an implementation with respect to a model is denoted by a so-called conformance relation. Conformance relations are relations between mathematical abstractions of implementations and models. Based on these conformance relations, different testing strategies have been defined. In this chapter, we concentrate on formal objects used to select test suites. These formal objects are so-called coverage criteria. A coverage criterion is a property that a selected test suite has to satisfy. We explore to which purposes these coverage criteria can be used for. Then we concentrate on the fault detection ability of a test suite satisfying a given coverage criterion. 11.1 Introduction All testing methodologies introduced in this book follow the same generic test process. Test cases are generated according to a given model of the implementation. The model results from a requirements analysis and has to be (if testing is done automatically) a formal description of the requirements. Test cases are sequences of input/output pairs and a finite set of test cases is called test suite. For each test case of a test suite, the input specified in the first pair of the sequence is refined with concrete data called test data. Test data are submitted to the implementation through its environment. The implementation generates a result which is captured through its environment. The result is compared (with respect to a conformance relation) to the output specified in the pair. If the conformance relation is not contradicted, the process goes on with the following pair. If generated outputs all correspond to the intended outputs, the test case is executed successfully. If all the test cases of the test suite are executed successfully, a success verdict is assigned to the test process, since no test case of the test suite allows to show that the implementation does not conform to the specification. Figure 11.1 shows this testing framework. The number of test cases required to obtain confidence in the system under test is usually infinitely large for real life applications. Consequently, a so called domain expert is involved in the test process, as he is able to extract interesting test suites due to his knowledge. For automated test case generation, the problem remains unsolved. So, for current testing practices, one of the open questions is: Which test suite should be extracted from a possibly infinite set of test cases? M. Broy et al. (Eds.): Model-Based Testing of Reactive Systems, LNCS 3472, pp. 293-322, 2005. © Springer-Verlag Berlin Heidelberg 2005
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Lecture Notes in Computer Science 3
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Volume Editors Manfred Broy Martin
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VI Preface The last part of the boo
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VIII Contents 13 Real-Time and Hybr
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2 Part I. Testing of Finite State M
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1 Homing and Synchronizing Sequence
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s2 a/1 1 Homing and Synchronizing S
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1.3.2 Computing Synchronizing Seque
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A1 A2 Bad 1 Homing and Synchronizin
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36 Moez Krichen b/1 a/0 s1 b/1 a/1
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38 Moez Krichen Now, even for minim
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40 Moez Krichen the algorithms for
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42 Moez Krichen ∀ s, s ′ ∈ S
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44 Moez Krichen In this proposition
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46 Moez Krichen Proposition 2.6. If
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48 Moez Krichen Algorithm 5 Checkin
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50 Moez Krichen (5) Edges emanating
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52 Moez Krichen graph of this machi
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54 Moez Krichen v12 v6 v11 1 I = {s
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56 Moez Krichen B of π, a is a-val
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58 Moez Krichen I = {s1, s2, s3, s4
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60 Moez Krichen Definition 2.19. A
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62 Moez Krichen Algorithm 7 Computi
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64 Moez Krichen Algorithm 8 Computi
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66 Moez Krichen The two authors als
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3 State Verification Henrik Björkl
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a/1 s1 s3 b/1 a/1 b/1 a/0 s2 s4 3 S
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3 State Verification 73 Thus (s, Q)
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3 State Verification 75 0, and x ca
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s1 s3 a/0 b/0 a/1 s2 s4 3 State Ver
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3.4.2 Naik’s Algorithm 3 State Ve
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s1 s2 s3 s1 s3 s3 a/0 a/0 s1 s2 s3
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3 State Verification 83 Since the m
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3 State Verification 85 x = a1a2 ..
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4 Conformance Testing Angelo Gargan
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4 Conformance Testing 89 the test u
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4 Conformance Testing 91 state. For
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4 Conformance Testing 93 This check
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s1 s1 a b s2 s2 a b s3 4 Conformanc
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4 Conformance Testing 97 Using a Q
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4 Conformance Testing 99 this case
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4.4.5 Cost and Length 4 Conformance
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t τ (t,si−1) x τti−1 ,si si
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si 1 2 w1 t i w 2 3 a: in MS si 1 w
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4 Conformance Testing 107 ti = δ(s
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4 Conformance Testing 109 Example.
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4 Conformance Testing 111 • If on
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114 Part II. Testing of Labeled Tra
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5 Preorder Relations ∗ Stefan D.
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5 Preorder Relations 119 power of r
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5 Preorder Relations 121 To summari
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5 Preorder Relations 123 Two import
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∧ ⊥⊤ ⊥ ⊥⊥ ⊤ ⊥⊤
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5 Preorder Relations 127 Definition
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5 Preorder Relations 129 For one th
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5 Preorder Relations 131 We close t
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s a b t 5 Preorder Relations 133 y
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5 Preorder Relations 135 (1) p ⊑m
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a p ′ τ b p ′′ τ τ a a b 5
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5 Preorder Relations 139 It should
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coin coin e c coin coin τ 5 Preord
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5 Preorder Relations 143 for free.
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5 Preorder Relations 145 condition
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5 Preorder Relations 147 ⊑←→
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5 Preorder Relations 149 The utilit
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152 Valéry Tschaen The labels repr
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154 Valéry Tschaen Intuitively, th
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156 Valéry Tschaen Definition 6.2.
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158 Valéry Tschaen By this theorem
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160 Valéry Tschaen The test suite
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162 Valéry Tschaen each sequence (
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164 Valéry Tschaen and B2 are LOTO
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166 Valéry Tschaen 6.4.2 The CO-OP
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168 Valéry Tschaen a τ q0 τ τ q
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170 Valéry Tschaen Concerning the
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7 I/O-automata Based Testing Machie
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7 I/O-automata Based Testing 175 th
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7 I/O-automata Based Testing 177 in
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7 I/O-automata Based Testing 179 sp
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7 I/O-automata Based Testing 181 na
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7 I/O-automata Based Testing 183 Un
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7 I/O-automata Based Testing 185 We
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7 I/O-automata Based Testing 187 fa
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7 I/O-automata Based Testing 189 Th
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7 I/O-automata Based Testing 191 Ac
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7 I/O-automata Based Testing 193 vi
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7 I/O-automata Based Testing 195 De
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7 I/O-automata Based Testing 197 To
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7 I/O-automata Based Testing 199 In
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8 Test Derivation from Timed Automa
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s0 on, true, {c} off , c =5, ∅ 8
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8.3 Testing Event Recording Automat
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[s1, z], z = con < 5, 8 Test Deriva
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Ψ(S ′ )={PE ′ | E ′ ∈ 2E(S
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{s0}, p0 p0 : tt 8 Test Derivation
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s0 c = ∞ 8 Test Derivation from T
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Example. The Light Switch can be de
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��s0� ,c=0.0 s0 en, on, {c :=
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��s0� ,c=0 s0 8 Test Derivati
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234 Verena Wolf to probabilistic tr
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236 Verena Wolf • A finite trace
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Page 275 and 276: Part III Model-Based Test Case Gene
Page 277 and 278: Part III. Model-Based Test Case Gen
Page 279 and 280: 282 Alexander Pretschner and Jan Ph
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12 Technology of Test-Case Generati
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12.5 Summary 12 Technology of Test-
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13 Real-Time and Hybrid Systems Tes
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Test Driver SUT 13 Real-Time and Hy
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fitness 13 Real-Time and Hybrid Sys
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13.5 Summary 13 Real-Time and Hybri
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390 Part IV. Tools and Case Studies
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392 Axel Belinfante, Lars Frantzen,
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440 Wolfgang Prenninger, Mohammad E
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Part V Standardized Test Notation a
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466 George Din inter-operability te
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468 George Din • Tabular Presenta
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470 George Din 16.3.1 Test Building
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472 George Din Abstract Test System
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474 George Din field can be marked
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476 George Din • omit: the value
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478 George Din altstep Default() ru
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480 George Din alt { [] httpPort.re
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482 George Din • Test Management
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484 George Din Value Type getType()
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486 George Din This task is rather
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488 George Din hosts, of preparing
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490 George Din A B C D MEM = 256 MB
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492 George Din A hardware load moni
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494 George Din ptcType2 ptcType3
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496 George Din communicate with the
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498 Zhen Ru Dai U2TP document is no
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500 Zhen Ru Dai state machines, sta
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502 Zhen Ru Dai TestResult TestCase
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504 Zhen Ru Dai can be mapped to JU
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506 Zhen Ru Dai 17.4 Test Developme
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508 Zhen Ru Dai Slave: Master: SRI
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510 Zhen Ru Dai sa: Slave− Appli
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512 Zhen Ru Dai sdConnect_To_Master
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514 Zhen Ru Dai BluetoothUnitTest
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516 Zhen Ru Dai is returned to the
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518 Zhen Ru Dai (1) /* test configu
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520 Zhen Ru Dai (1) /* test case */
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Part VI Beyond Testing This last pa
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526 Séverine Colin and Leonardo Ma
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19 Model Checking Therese Berg 1 an
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19 Model Checking 559 The first sta
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19 Model Checking 561 function I :
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coffee coin tea 19 Model Checking 5
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AX (φ) :=¬EX (¬φ) AF (φ) :=Atr
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19 Model Checking 567 Another appro
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19 Model Checking 569 has a transit
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19 Model Checking 571 The alternati
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19 Model Checking 573 Obviously the
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19 Model Checking 575 purposes ther
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19 Model Checking 577 otherwise it
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19 Model Checking 579 Expanding a P
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19 Model Checking 581 We conduct an
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• SA ⊆ Σ ∗ is a nonempty fin
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19 Model Checking 585 When OT is cl
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19 Model Checking 587 • se = s
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19 Model Checking 589 the new colum
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19 Model Checking 591 Henceforth th
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19 Model Checking 593 DT , the tran
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19 Model Checking 595 queries. At t
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19 Model Checking 597 Assistant 4.
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19 Model Checking 599 have created
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19 Model Checking 601 Logic (see Se
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19 Model Checking 603 linear time l
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20 Model-Based Testing - A Glossary
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20 Model-Based Testing - A Glossary
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612 Bengt Jonsson a/0 b/0 b/1 s2 s4
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614 Bengt Jonsson of input symbols
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616 Joost-Pieter Katoen The followi
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618 Literature [AFH94] Rajeev Alur,
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620 Literature [BCMD90] J. R. Burch
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622 Literature [BRV95] Ed Brinksma,
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624 Literature [CL97a] Duncan Clark
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626 Literature [DGNP04] Z. R. Dai,
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628 Literature [FHP02] Eitan Farchi
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630 Literature [GL02] Hubert Garave
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632 Literature [Hib61] Thomas N. Hi
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634 Literature [HR01b] Klaus Havelu
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636 Literature [KKL + 01] M. Kim, S
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638 Literature [LPY97] Kim Guldstra
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640 Literature [Müh97] H. Mühlenb
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642 Literature [Pha93] M. Phalippou
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644 Literature [RdBJ00] V. Rusu, L.
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646 Literature [Sch00] Johann M. Sc
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648 Literature [SVG02] S. Schulz an
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650 Literature [Vas73] M. P. Vasile
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Index =⇒ , 175 ioco, 187 ioconf,
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homing sequence, 8 - adaptive, 8, 2
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eset sequence, see synchronizing se
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timed transition system, 223, 360,
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