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Lecture Notes in Computer Science 3472

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428 Axel Bel<strong>in</strong>fante, Lars Frantzen, and Christian Schallhart<br />

use wildcards to specify abstract test purposes which are completed by the tool<br />

<strong>in</strong> every possible way to allow abstraction from event-order<strong>in</strong>g. AGEDIS offers<br />

five predef<strong>in</strong>ed strategies to generate test purposes:<br />

• Random test generation<br />

• State coverage – ideally cover all states of the specification<br />

• Transition coverage – ideally cover all transitions of the specification<br />

• Interface coverage – ideally cover all controllable and observable <strong>in</strong>terface<br />

elements<br />

• Interface coverage with parameters – like <strong>in</strong>terface coverage with all parameter<br />

comb<strong>in</strong>ations<br />

The abstract specification parts like classes, objects, methods and data types<br />

have to be mapped to the SUT. This, and the test architecture itself, is described<br />

<strong>in</strong> an XML schema which <strong>in</strong>stantiates the test execution directives <strong>in</strong>terface.<br />

The model execution <strong>in</strong>terface encodes all the behavior models of the SUT,<br />

i.e. the classes, objects and state mach<strong>in</strong>es. Aga<strong>in</strong> IF is used to do so. See also<br />

here the web site for a detailed description.<br />

Both the abstract test suite and test suite traces are described by the same<br />

XML schema. A test suite consists of a set of test cases, zero or more test suite<br />

traces and a description of the test creation model. Each test case consists of a<br />

set of test steps which <strong>in</strong> turn may consist of stimuli (method calls), observations,<br />

directions for cont<strong>in</strong>uation or verdicts. Several stimuli may occur <strong>in</strong> one test step<br />

and they can be executed sequentially or <strong>in</strong> parallel. The common verdicts pass,<br />

fail and <strong>in</strong>conclusive are possible. Alternative behavior with<strong>in</strong> a test case is used<br />

to model nondeterm<strong>in</strong>ism. Test cases can also be parameterized to be run with<br />

different values and other test cases can be evoked with<strong>in</strong> a test case. AGEDIS is<br />

restricted to static systems, i.e. objects can not be created or destructed dur<strong>in</strong>g<br />

test case execution.<br />

The AGEDIS tools are written <strong>in</strong> Java. Currently, the specification model<strong>in</strong>g<br />

<strong>in</strong> AML and the creation of test generation directives are only supported us<strong>in</strong>g<br />

the commercial Objecteer<strong>in</strong>g UML Editor together with an AML profile. The<br />

designed model can be simulated with an IF-simulator. Test generation based<br />

on the model and the test generation directives is done by the TGV algorithms.<br />

AGEDIS also allows an execution of the generated test suite. The execution<br />

framework is called Spider. It is able to execute test cases on distributed components<br />

written <strong>in</strong> Java, C or C++. Spider takes care of the distribution of the<br />

generated test objects. Furthermore it controls the whole test run, i.e. provid<strong>in</strong>g<br />

synchronous or asynchronous stimuli, observ<strong>in</strong>g the outputs, check<strong>in</strong>g them<br />

aga<strong>in</strong>st the specification and writ<strong>in</strong>g the generated traces <strong>in</strong> the suite as XML<br />

files. Two tools are provided for test analysis, a coverage and a defect analyzer.<br />

The first one checks for uncovered data value comb<strong>in</strong>ations and method calls.<br />

It generates new test cases to cover these missed parts and a coverage analysis<br />

report. The defect analyzer tries to cluster traces which lead to the same fault<br />

and generates one s<strong>in</strong>gle fault-trace out of them to ease the analysis when many<br />

faults are detected.

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