Thermal properties in mesoscopics: physics and ... - ResearchGate
Thermal properties in mesoscopics: physics and ... - ResearchGate
Thermal properties in mesoscopics: physics and ... - ResearchGate
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on the cross-over between two noise mechanisms, both<br />
of which represent white noise, whereby the frequency<br />
w<strong>in</strong>dow is ideally not a concern, s<strong>in</strong>ce the same readout<br />
system is used <strong>in</strong> all the bias regimes. Moreover, the<br />
ga<strong>in</strong>s of the amplifiers are not that critical either because<br />
of the same argument. One can also use relatively high<br />
b<strong>and</strong>width which <strong>in</strong>creases the absolute noise signal to be<br />
measured, <strong>and</strong> thereby makes the measurement faster.<br />
The SNT technique has a few further attractive features.<br />
It is likely that its operation can be easily extended<br />
up to higher temperatures despite the deviations<br />
observed <strong>in</strong> the first experiments. The sensor consists<br />
of just one, relatively large size tunnel junction, which<br />
means that it is easy to fabricate with high precision.<br />
Also it is likely, although not yet demonstrated, that the<br />
SNT is not sensitive to magnetic field, s<strong>in</strong>ce its operation<br />
is based on tunnell<strong>in</strong>g characteristics <strong>in</strong> a NIN tunnel<br />
junction as <strong>in</strong> CBT.<br />
F<strong>in</strong>ally, noise measurements can <strong>in</strong> pr<strong>in</strong>ciple be used<br />
to measure the distribution function <strong>in</strong> non-equilibrium<br />
as well, as proposed by Pistolesi et al. (2004).<br />
D. Thermometry based on the temperature dependent<br />
conductance of planar tunnel junctions<br />
The effect of temperature on the current across a tunnel<br />
barrier with f<strong>in</strong>ite height is a suitable basis for thermometry<br />
<strong>in</strong> a wide temperature range (Gloos et al.,<br />
2000). Simmons (1963a) showed that the tunnell<strong>in</strong>g conductance<br />
at zero bias across a th<strong>in</strong> <strong>in</strong>sulat<strong>in</strong>g barrier depends<br />
on temperature as<br />
G(T ) = G0[1 + (T/T0) 2 ], (61)<br />
where G0 is the temperature <strong>in</strong>dependent part of conductance<br />
<strong>and</strong> the scal<strong>in</strong>g temperature T0 depends on the<br />
barrier height φ0. For a rectangular barrier of width s one<br />
has T 2 0 = 32 φ0<br />
π 2 k 2 B ms2 , where m is the effective mass of the<br />
electrons with<strong>in</strong> the <strong>in</strong>sulat<strong>in</strong>g barrier. Experiments over<br />
a temperature range from 50 K up to 400 K on Al-AlOx-<br />
Al tunnel junctions have demonstrated that Eq. (61) is<br />
obeyed remarkably well (Gloos et al., 2000; Suoknuuti<br />
et al., 2001). Moreover, <strong>in</strong> these measurements the scal<strong>in</strong>g<br />
temperature was found to be T0 720 K <strong>in</strong> all samples,<br />
without a clear dependence on the specific (zero<br />
temperature) conductance of the barrier, which varied<br />
over three orders of magnitude from 3 µS/µm 2 up to 3000<br />
µS/µm 2 . This property makes the method attractive <strong>in</strong><br />
wide range thermometry, <strong>and</strong> T0 can <strong>in</strong>deed be considered<br />
as a material specific, but geometry <strong>and</strong> thickness<br />
<strong>in</strong>dependent parameter up to a certa<strong>in</strong> accuracy.<br />
E. Anderson-<strong>in</strong>sulator th<strong>in</strong> film thermometry<br />
As regards to temperature read-out of microcalorimetric<br />
devices, resistive th<strong>in</strong> film thermometers<br />
near the metal-<strong>in</strong>sulator transition (MIT) are relatively<br />
23<br />
FIG. 16 The suspended thermal sensor employed <strong>in</strong> (Bourgeois<br />
et al., 2005). The Nbx ′N1−x ′ thermometer can be seen<br />
<strong>in</strong> the lower part of the rectangular silicon membrane. The<br />
450 000 Al superconduct<strong>in</strong>g r<strong>in</strong>gs are located <strong>in</strong> the middle<br />
part of the membrane; examples of them are shown <strong>in</strong> (b) <strong>and</strong><br />
(c). Figure from (Bourgeois et al., 2005).<br />
popular. Electrical resistivity <strong>properties</strong> on both sides<br />
of the MIT are rather well understood (Belitz <strong>and</strong> Kirkpatrick,<br />
1994), <strong>and</strong> <strong>in</strong> general resistance of such th<strong>in</strong> films<br />
shows strong temperature dependence, suitable for thermometry<br />
<strong>and</strong> <strong>in</strong> particular for calorimetry. On the <strong>in</strong>sulator<br />
side resistivity ρ is determ<strong>in</strong>ed by hopp<strong>in</strong>g, <strong>and</strong><br />
it has typically ρ ∝ e (T0/T ) n<br />
temperature dependence,<br />
with T0 <strong>and</strong> n constants. On the metallic side, weaker<br />
dependence can be found. In practice, both NbxSi1−x<br />
(Denl<strong>in</strong>ger et al., 1994; Marnieros et al., 1999, 2000) <strong>and</strong><br />
Nbx ′N1−x ′ (Bourgeois et al., 2005; Fom<strong>in</strong>aya et al., 1997)<br />
th<strong>in</strong> film based thermometers have been successfully employed.<br />
The suitable conduction regime can be tailored<br />
by adjust<strong>in</strong>g x (x ′ ) <strong>in</strong> electron beam co-evaporation (Denl<strong>in</strong>ger<br />
et al., 1994) or <strong>in</strong> dc magnetron sputter<strong>in</strong>g of Nb<br />
<strong>in</strong> a nitrogen atmosphere (Fom<strong>in</strong>aya et al., 1997).<br />
Bolometric <strong>and</strong> calorimetric radiation detectors are<br />
discussed <strong>in</strong> detail <strong>in</strong> Sec. IV. Here we briefly mention<br />
the application of a Nbx ′N1−x ′ thermometer <strong>in</strong> a measurement<br />
of the heat capacity of 450 000 superconduct<strong>in</strong>g<br />
th<strong>in</strong> film loops on a silicon membrane (Bourgeois et al.,<br />
2005), see Fig. 16. The heat capacity of the loops is proportional<br />
to their total mass, which was about 80 ng <strong>in</strong><br />
this case. Vortices enter<strong>in</strong>g simultaneously <strong>in</strong>to the 450<br />
000 loops under application of magnetic field could be<br />
observed. A similar measurement (L<strong>in</strong>dell et al., 2000),<br />
employ<strong>in</strong>g a NIS thermometer could resolve the specific<br />
heat jump at Tc of 14 th<strong>in</strong> film titanium disks with total<br />
mass of 1 ng on a silicon nitride membrane.