Thermal properties in mesoscopics: physics and ... - ResearchGate

J. Zmuidzinas (SPIE), volume 4855, pp. 1–18.
Holmes, W., J. M. Gildemeister, P. L. Richards, and V. Kotsubo,
1998, Applied Physics Letters 72, 2250.
Houzet, M., and F. Pistolesi, 2004, Phys. Rev. Lett. 92,
107004.
Howard, R. E., H. G. Craighead, L. D. Jackel, and P. M.
Mankiewich, 1983, J. Vac. Sci. Technol. B 1, 1101.
Huang, J., F. Pierre, T. T. Heikkilä, F. K. Wilhelm, and N. O.
Birge, 2002, Phys. Rev. B 66, 020507.
Huard, B., A. Anthore, F. Pierre, H. Pothier, N. O. Birge, and
D. Esteve, 2004, Solid State Communications 131, 599.
Humphrey, T. E., R. Newbury, R. P. Taylor, and H. Linke,
2002, Phys. Rev. Lett. 89, 116801.
Hunt, C. L., J. Bock, P. Day, A. Goldin, A. Lange, H. LeDuc,
A. Vayonakis, and J. Zmuidzinas, 2003, in Millimeter and
Submillimeter Detectors for Astronomy, edited by T. G.
Phillips and J. Zmuidzinas (SPIE), volume 4855, pp. 318–
321.
Hwang, T.-L., S. Schwarz, and D. Rutledge, 1979, Appl. Phys.
Lett. 34, 773.
Irwin, K. D., 1995, Appl. Phys. Lett. 66, 1998.
Irwin, K. D., and G. C. Hilton, 2005, in Cryogenic Particle
Detection, edited by C. Enss (Springer, Berlin, Heidelberg
(in press)), volume 99 of Topics Appl. Phys., ISBN
3540201130, p. 63.
Irwin, K. D., G. C. Hilton, D. A. Wollman, and J. M. Martinis,
1996, Appl. Phys. Lett. 69, 1945.
Irwin, K. D., G. C. Hilton, D. A. Wollman, and J. M. Martinis,
1998, J. Appl. Phys. 83, 3978.
Irwin, K. D., S. W. Nam, B. Cabrera, B. Chugg, G. Park,
R. P. Welty, and J. M. Martinis, 1995a, IEEE Trans. Appl.
Superc. 5, 2690.
Irwin, K. D., S. W. Nam, B. Cabrera, B. Chugg, and B. A.
Young, 1995b, Rev. Sci. Instrum. 66, 5322.
Jackel, L. D., R. E. Howard, P. M. Mankiewich, H. G. Craighead,
and R. W. Epworth, 1984, Appl. Phys. Lett. 45, 698.
Jaeger, C. J., 2002, Introduction to Microelectronic Fabrication
(Prentice Hall, New Jersey).
Jamoto, N., and R. Shimizu, 1983, J. Appl. Phys. 54, 3855.
Jensen, K. F., 1989, in Microelectronics Processing: Chemical
Engineering Aspects, edited by D. W. Hess and K. F.
Jensen (American Chemical Society, Washington), p. 199.
Ji, Y., G. J. Strijkers, F. Y. Yang, C. L. Chien, J. M. Byers,
A. Anguelouch, G. Xiao, and A. Gupta, 2001, Phys. Rev.
Lett. 86, 5585.
Jiang, Z., and V. Chandrasekhar, 2004, [cond-mat/0408419].
Jiang, Z., and V. Chandrasekhar, 2005a, [cond-mat/0501478].
Jiang, Z., and V. Chandrasekhar, 2005b, Phys. Rev. Lett. 94,
147002.
Jiang, Z., H. Lim, V. Chandrasekhar, and J. Eom, 2003, Appl.
Phys. Lett. 83, 2190.
Jochum, J., C. Mears, S. Golwala, B. Sadoulet, J. P. Castle,
M. F. Cunningham, O. B. Drury, M. Frank, S. E. Labov,
F. P. Lipschultz, H. Netel, and B. Neuhauser, 1998, J. Appl.
Phys. 83, 3217.
Johnson, J., 1928, Phys. Rev. 32, 97.
de Jong, M. J. M., and C. W. J. Beenakker, 1994, Phys. Rev.
B 49, 16070.
de Jong, M. J. M., and C. W. J. Beenakker, 1995, Phys. Rev.
Lett. 74, 1657.
Jönsson-˚Akerman, B., R. Escudero, C. Leighton, S. Kim, I. K.
Schuller, and D. A. Rabson, 2000, Appl. Phys. Lett. 77,
1870.
Kadlec, J., and K. H. Kadlec, 1975, Solid State Commun. 16,
54
621.
Kaganowicz, G., V. S. Ban, and J. W. Robinson, 1984, J. Vac.
Sci. Technol. A2, 1233.
Kajiyama, K., Y. Mizushima, and S. Sakata, 1973, Appl.
Phys. Lett. 23, 458.
Kaminski, A., and L. I. Glazman, 2001, Phys. Rev. Lett. 86,
2400.
Kämper, K. P., W. Schmitt, G. Güntherodt, R. J. Gambino,
and R. Ruf, 1987, Phys. Rev. Lett. 59, 2788.
Kapitulnik, A., 1992, Appl. Phys. Lett. 60, 180.
Kaplan, S. B., C. C. Chi, D. N. Langenberg, J. J. Chang,
S. Jafarey, and D. J. Scalapino, 1976, Phys. Rev. B 14,
4854.
Karasik, B. S., B. Delaet, W. R. McGrath, J. Wei, M. E.
Gershenson, and A. V. Sergeev, 2003, IEEE Trans. Appl.
Superc. 13, 188.
Karvonen, J. T., L. J. Taskinen, and I. J. Maasilta, 2005,
Phys. Rev. B 72, 012302.
Kastalsky, A., A. W. Kleinsasser, L. H. Greene, R. Bhat,
F. P. Milliken, and J. P. Harbison, 1991, Phys. Rev. Lett.
67, 3026.
Kautz, R. L., G. Zimmerli, and J. M. Martinis, 1993, J. Appl.
Phys. 73, 2386.
Kelley, R. L., M. D. Audley, K. R. Boyce, S. R. Breon, R. Fujimoto,
K. C. Gendreau, S. S. Holt, Y. Ishisaki, D. Mc-
Cammon, T. Mihara, K. Mitsuda, S. H. Moseley, et al.,
1999, in EUV, X-Ray, and Gamma-Ray Instrumentation
for Astronomy X, edited by O. Siegmund and K. Flanagan
(SPIE), volume 3765, pp. 114–127.
Kendall, D. L., and R. A. Shoultz, 1997, in Handbook of
Microlithography, Micromachining, and Microfabrication,
edited by P. Rai-Choudhury (SPIE Optical Engineering
Press, Bellingham), volume 2, p. 41.
Kenyon, M., 2005, Personal communication.
Kern, D. P., P. J. Coane, P. J. Houzego, and T. H. P. Chang,
1984, Solid State Technol. 22, 87.
Kindermann, M., and S. Pilgram, 2004, Phys. Rev. B 69,
155334.
Kittel, C., 1996, Introduction to Solid State Physics, 7th ed.
(John Wiley & Sons, New York).
Kivinen, P., A. Savin, M. Zgirski, P. Törmä, J. Pekola,
M. Prunnila, and J. Ahopelto, 2003, J. Appl. Phys. 94,
3201.
Klitsner, T., and R. O. Pohl, 1987, Phys. Rev. B 36, 6551.
Knoedler, C., 1983, J. Appl. Phys 54, 2773.
Kobayashi, K. I., T. Kimura, H. Sawada, K. Terakura, and
Y. Tokura, 1998, Nature 395, 677.
Koga, T., S. B. Cronin, M. S. Dresselhaus, J. L. Liu, and
K. L. Wang, 2000, Appl. Phys. Lett. 77, 1490.
Koga, T., X. Sun, S. B. Cronin, and M. S. Dresselhaus, 1998,
Appl. Phys. Lett. 73, 2950.
Koga, T., X. Sun, S. B. Cronin, and M. S. Dresselhaus, 1999,
Appl. Phys. Lett. 75, 2438.
Kogan, V. R., V. V. Pavlovskii, and A. F. Volkov, 2002, Europhys.
Lett. 59, 875.
Korotkov, A. N., and K. K. Likharev, 1999, Appl. Phys. Lett.
75, 2491.
de Korte, P. A. J., J. Beyer, S. Deiker, G. C. Hilton, and
K. D. Irwin, 2003, Rev. Sci. Instrum. 74, 3807.
Koyanagi, K., S. Kasai, and H. Hasegawa, 1993, Jpn. J. Appl.
Phys. 32, 502.
Kroha, J., and A. Zawadowski, 2002, Phys. Rev. Lett. 88,
176803.
Kuhn, T., D. V. Anghel, J. P. Pekola, M. Manninen, and