PhD Thesis_RuiMSMartins.pdf - RUN UNL

In-situ XRD studies during growth of Ni-Ti SMA films and their complementary ex-situ characterization
2.2. EX-SITU XRD CHARACTERIZATION
At the XRD laboratory of the Institute of Ion Beam Physics and Materials Research (at
FZD), two equipments were also very useful for this work:
• Diffractometer D-5000 (BRUKER AXS);
• Diffractometer D-5005 (BRUKER AXS) with quarter-circle Eulerian cradle for
powder diffraction, orientation of single crystals, and texture studies.
A series of samples was investigated by complementary ex-situ experiments at RT on
the BRUKER AXS D5000 (Fig. 2.10) using Cu-K α radiation. The diffraction experiments
were performed in grazing incidence (incidence angle = 1º) geometry off-plane (GIXD), to
control the penetration depth and to increase the sensitivity.
Fig. 2.10: Diffractometer D-5000 (BRUKER AXS).
Ni-Ti samples were also investigated by ex-situ XRD experiments at RT and 100°C on
the BRUKER AXS D5005 diffractometer (Fig. 2.11) using Cu-K α radiation in off-plane
Bragg-Brentano geometry.
Chapter 2 – Experimental Details 90