PhD Thesis_RuiMSMartins.pdf - RUN UNL

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In-situ XRD studies during growth of Ni-Ti SMA films and their complementary ex-situ characterization the Ti:Ni ratio during the deposition of Ni-Ti films are presented (the first reported studies on the topic). During the in-situ study, the evolution of the intermediate structural “states” of the growing film has been identified, which cannot be seen/revealed ex-situ, because those states occurred only during the growth but were no longer detectable after deposition. Chapter 4 discusses the preferential orientation of the films, the interface analysis and their link with the phase transformation characteristics. In chapter 5, conclusions are presented based on the in-situ and ex-situ characterization of the samples studied during the present work. Furthermore, suggestions for future work are given. Introduction 5
In-situ XRD studies during growth of Ni-Ti SMA films and their complementary ex-situ characterization Chapter 1 Background and Literature Review Chapter 1 - Background and Literature Review 6
Page 1 and 2: RUI MIGUEL DOS SANTOS MARTINS IN-SI
Page 3 and 4: ACKNOWLEDGEMENTS The research work
Page 5 and 6: At CENIMAT, Luís Pereira also carr
Page 7 and 8: SUMÁRIO O fabrico de películas fi
Page 9 and 10: LIST OF SYMBOLS AND ABREVIATIONS α
Page 11 and 12: TABLE OF CONTENTS Introduction ....
Page 13 and 14: LIST OF FIGURES Fig. 1.1: Power/wei
Page 15 and 16: Fig. 2.3: Calculated integrated pho
Page 17 and 18: Fig. 3.25: Pole figures of Ni-Ti B2
Page 19 and 20: Fig. 3.66: SAED pattern obtained on
Page 21 and 22: LIST OF TABLES Tab. 1.1: Factors af
Page 23 and 24: In-situ XRD studies during growth o
Page 25: In-situ XRD studies during growth o
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