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RTS200 RFID Test Set - RFID Webshop

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ANNEX 2<br />

T EST PROPERT IES<br />

The next table shows the set of properties defined for the current <strong>RTS200</strong> version for electrical<br />

tests.<br />

Property name Description Comments<br />

TEST CONDITIONS<br />

TEST_TYPE<br />

Type of test to be<br />

performed<br />

* <strong>Test</strong>s marked with (*) are not<br />

implemented in the firmware.<br />

They are only intended for<br />

laboratory use<br />

TST_RES_FRQ<br />

TST_UN_RES_FRQ (*)<br />

TST_LO_RES_FRQ (*)<br />

TST_Q<br />

Resonant frequency test<br />

Unloaded resonant frequency test<br />

Loaded resonant frequency test<br />

Q test<br />

START_FREQ Lower freq. For the test In Hz, KHz or MHz<br />

STOP_FREQ Upper freq. For the test In Hz , KHz or MHz<br />

RF_LEVEL RF level for the test In terms of field (mA/m, A/m , ...) or voltage (V, mV, uV)<br />

N_SAMPLES Samples Number of measuring points between low and up. Freq<br />

TRIES Number of times to test Repeats until NTRIES if the test is not successful. 0 means Level Trigger, that is, the test<br />

will be repeated until a good result is obtained or the trigger signal goes back to its<br />

original state.<br />

TEST_PERIOD Periodicity of test The test is performed every TEST_PERIOD tests<br />

POSDET_FILTER<br />

IF_BANDWIDTH<br />

VIDEO_FILTER (for<br />

compatibility reasons)<br />

Post-detection filter The post-detection filter bandwidth. It can take the values 100 Hz, 1 KHz, 10 KHz, 25<br />

KHz, 50 KHz, 75 KHz, 100 KHz, 150 KHz or 200 Khz.<br />

(Any of the three property names are valid and equivalent)<br />

REFERENCE_LEVEL Analyzer ref. Level In voltage units (V, mV, uV, ...)<br />

HP Filter Demod. High Pass filter Selection of filter. Digital value from 1 to 15<br />

DETECTOR Demodulator Only Linear option can be selected here<br />

TEST_ANTENNA_TYPE Model of antenna to use TESPR1000,TESPR1001,TESPR1002,TESPR1003<br />

DISTANCE_TO_ANTENNA Antenna-tag distance Used to control Field level in tag with precision<br />

TRACKING_GENERATOR Enabling of tracking ON/OFF<br />

RF_GENERATOR_ENABLED<br />

YIELD_THRESHOLD_LT<br />

YIELD_THRESHOLD_ST<br />

TEST LIMITS<br />

Enabling of tracking<br />

generator<br />

Long term yield threshold<br />

(defined in test suite)<br />

Short term yield threshold<br />

(defined in test suite)<br />

ON/OFF<br />

For lower values of LT yield, a red alarm indication appears on screen<br />

For lower values of ST yield, a red alarm indication appears on screen<br />

RESULT TYPE Type of result of the test Int, string, bool<br />

MIN_GRAPH Lower limit for SPC graph Should be minimum expected value for measurement<br />

MAX_GRAPH Upper limit for SPC graph Should be maximum expected value for measurement<br />

NUM_GRAPH<br />

Number of points in SPC<br />

graph<br />

LIMIT_MIN_FRQ Freq. Lower limit for test Minimum frequency measurement to consider the test valid<br />

LIMIT_MAX_FRQ Freq. Upper limit for test Maximum frequency measurement to consider the test valid<br />

LIMIT_MIN_LEV Level lower limit for test Minimum level measurement to consider the test valid<br />

LIMIT_MAX_LEV Level upper limit for test Maximum level measurement to consider the test valid<br />

LIMIT_MIN_Q Lower limit for Q In electrical measurements<br />

Pag: 33 Document: <strong>RTS200</strong> <strong>RFID</strong> <strong>Test</strong> <strong>Set</strong> Code: 001.0036 Version: 1

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